Advances in STEM Techniques for Materials Characterization
Abstract
High EDS Count Rates Achieved by Design Improvements for an Analytical Transmission Electron Microscope.
-
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1364-1365
-
- Article
-
- You have access
- Export citation
The Development of Ultra-high Vacuum Cs-Corrected Scanning Transmission Electron Microscope for Fast Fabrication of Desired Nanostructures
-
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1366-1367
-
- Article
-
- You have access
- Export citation
Low-Voltage Dark-Field STEM Imaging with Optimum Detection Angle
-
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1368-1369
-
- Article
-
- You have access
- Export citation
Design Advances and New Results of a Sub-Ångström Dedicated Corrector S/TEM
-
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1370-1371
-
- Article
-
- You have access
- Export citation
A New Era of Analysis with Spherical-Abervation Corrected STEM - Atomic and Electronic Information Approaching the Single Atom Level
-
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1372-1373
-
- Article
-
- You have access
- Export citation
[1-100]/(11-22) Twin Boundaries in Wurtzite ZnO and Group III-Nitrides
-
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1374-1375
-
- Article
-
- You have access
- Export citation
Chemical Imaging in Microanalysis: 50th Anniversary of X-ray Mapping
Abstract
Early X-ray Mapping in Electron Probe Microanalysis
-
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1376-1377
-
- Article
-
- You have access
- Export citation
Improvements in Mapping and Microanalysis by FEG-EPMA
-
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1378-1379
-
- Article
-
- You have access
- Export citation
X-ray Mapping in the Spectrum Image Mode at Output Count Rates above 100 kHz with the Silicon Drift Detector (SDD)
-
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1380-1381
-
- Article
-
- You have access
- Export citation
Sensitivity and Accuracy in Processing X-ray Spectrum Images
-
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1382-1383
-
- Article
-
- You have access
- Export citation
Cryo-STEM EELS Mapping of Polymer Nanocolloids Preserved in Amorphous Ice
-
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1384-1385
-
- Article
-
- You have access
- Export citation
2D and 3D Elemental Mapping of Biological Structures by Energy-Filtered TEM
-
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1386-1387
-
- Article
-
- You have access
- Export citation
Uncovering Nanoscale Chemical Variations in the Third Dimension; Electron Tomography in the Analytical Mode
-
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1388-1389
-
- Article
-
- You have access
- Export citation
Spectral Imaging and Multivariate Statistical Analysis from Thin Specimens in the SEM with a Four-Channel Silicon Drift Detector
-
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1390-1391
-
- Article
-
- You have access
- Export citation
Chemical Imaging with Auger Electron Spectroscopy
-
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1392-1393
-
- Article
-
- You have access
- Export citation
Measuring Pixel Classification Accuracy Using Synthetic Spectrum Images
-
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1394-1395
-
- Article
-
- You have access
- Export citation
Chemical Imaging by Soft X-ray Scanning Transmission X-ray Microscopy
-
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1396-1397
-
- Article
-
- You have access
- Export citation
Compositional Imaging at the Atomic Scale with Atom Probe Tomography
-
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1398-1399
-
- Article
-
- You have access
- Export citation
3-D Characterization of Biomaterials with Cluster SIMS
-
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1400-1401
-
- Article
-
- You have access
- Export citation
Multi-technique, Multivariate Analysis Methods for Enhanced Sample Characterization
-
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1402-1403
-
- Article
-
- You have access
- Export citation