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Volume 12 - Issue S02 - August 2006

Contents

Page 35 of 45

Advances in STEM Techniques for Materials Characterization

Abstract

  • High EDS Count Rates Achieved by Design Improvements for an Analytical Transmission Electron Microscope.

  • N Rowlands, S von Harrach, C Tyrrell, F van Uden
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1364-1365
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Low-Voltage Dark-Field STEM Imaging with Optimum Detection Angle

  • A Morikawa, C Kamiya, S Watanabe, M Nakagawa, T Ishitani
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1368-1369
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Design Advances and New Results of a Sub-Ångström Dedicated Corrector S/TEM

  • M Van der Stam, B Freitag, R Erni, P Tiemeijer, M Stekelenburg, D Hubert, J Ringnalda
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1370-1371
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • [1-100]/(11-22) Twin Boundaries in Wurtzite ZnO and Group III-Nitrides

  • Y Yan, M Al-Jassim, M Chisholm, L Boatner, SJ Pennycook, M Oxley
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1374-1375
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Chemical Imaging in Microanalysis: 50th Anniversary of X-ray Mapping

Abstract

  • Early X-ray Mapping in Electron Probe Microanalysis

  • P Duncumb
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1376-1377
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Improvements in Mapping and Microanalysis by FEG-EPMA

  • CM MacRae, N Wilson, S Notoya
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1378-1379
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • X-ray Mapping in the Spectrum Image Mode at Output Count Rates above 100 kHz with the Silicon Drift Detector (SDD)

  • D Newbury
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1380-1381
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Sensitivity and Accuracy in Processing X-ray Spectrum Images

  • P Statham
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1382-1383
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Cryo-STEM EELS Mapping of Polymer Nanocolloids Preserved in Amorphous Ice

  • G Kim, A Sousa, D Meyers, M Shope, M Libera
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1384-1385
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • 2D and 3D Elemental Mapping of Biological Structures by Energy-Filtered TEM

  • RD Leapman, G Zhang, LM Dorward, VV Speransky, MA Aronova
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1386-1387
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Uncovering Nanoscale Chemical Variations in the Third Dimension; Electron Tomography in the Analytical Mode

  • M Weyland, A Yurtsever, P Ercius, D Muller
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1388-1389
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Spectral Imaging and Multivariate Statistical Analysis from Thin Specimens in the SEM with a Four-Channel Silicon Drift Detector

  • PG Kotula, JR Michael
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1390-1391
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Chemical Imaging with Auger Electron Spectroscopy

  • S Wight
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1392-1393
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Measuring Pixel Classification Accuracy Using Synthetic Spectrum Images

  • JH Scott, N Ritchie
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1394-1395
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Chemical Imaging by Soft X-ray Scanning Transmission X-ray Microscopy

  • AP Hitchcock, D Hernández-Cruz, JJ Dynes, M-E Rousseau, M Pézolet
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1396-1397
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Compositional Imaging at the Atomic Scale with Atom Probe Tomography

  • T Kelly, J Bunton, K Thompson, D Larson, R Ulfig, S Kostrna, T Prosa
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1398-1399
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • 3-D Characterization of Biomaterials with Cluster SIMS

  • C Mahoney, G Gillen, A Fahey, J Yu, JA Gardella
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1400-1401
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Multi-technique, Multivariate Analysis Methods for Enhanced Sample Characterization

  • K Artyushkova, S Pylypenko, J Fenton, K Archuleta, L Williams, J Fulghum
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1402-1403
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Page 35 of 45