Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
  1. Home
  2. Journals
  3. Microscopy and Microanalysis
  4. Volume 12 Issue s02
Journal Home
Refine listing

Refine listing

Access:
Publication date:
Topic: Show more

Actions for selected content:

Select all | Deselect all
  • View selected items
  • Export citations
  • Download PDF (zip)
  • Save to Kindle
  • Save to Dropbox
  • Save to Google Drive

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Please provide a title, maximum of 40 characters.
Cancel
×
< Back to all issues

Volume 12 - Issue S02 - August 2006

Contents

Page 38 of 45

Present and future limits of variable pressure and environmental SEM: Enabling nanoscale metrology, improved x-ray microanalysis and the understanding of novel contrasts in images of modern and novel materials

Abstract

  • Comparison of the Swelling of Treated and Untreated Hair Using an Environmental Electron Microscope (ESEM)

  • P Hallégot, S Diridollou, V Holloway-Barbosa, F Leroy, NJ Zaluzec
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1484-1485
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Wet STEM - A New SEM Method Revealing High Resolution Transmitted Information from Hydrated Samples

  • I Gestmann, D Bultreijs, E Baken, B Lich
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1486-1487
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Report from the NIST-MAS-AMAS Roadmap Workshop on Variable Pressure Scanning Electron Microscopy/Environmental Scanning Electron Microscopy

  • S Wight, D Newbury, B Griffin
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1488-1489
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • The Effect of the Charge Compensating Gas and Beam Gas Path Length on X-ray Analysis in the Variable Pressure SEM

  • SJ Bean, VM Kugler
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1490-1491
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Performance of X-ray Microanalysis in the Variable Pressure or Environmental Scanning Electron Microscope

  • J-F Le Berre, K Robertson, R Gauvin, GP Demopoulos
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1492-1493
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Current Status of Quantitative X-ray Microanalysis in VP-ESEM

  • R Carlton
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1494-1495
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Visualization of the Electron-solid Interaction Volume in Dielectric Materials Under Variable Pressure Conditions

  • B Myers, V Dravid
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1498-1499
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Dynamic Volume Change Measurement in Environmental Scanning Electron Microscope

  • X Tang, M De Rooij
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1500-1501
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Correlative Analysis of Polymer Materials Using Low Voltage and Variable Pressure SEM

  • S Okerstrom, K Pham
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1502-1503
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Imaging of Bacterial External Polymeric Substances by Methods of SEM

  • B Arey, A Laskin, A Dohnalkova
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1504-1505
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Scanning Electron Microscopy

Abstract

  • 3D Reconstruction of Surfaces with Steep Slopes from Multiple SEM Images

  • R Danzl, F Helmli, S Scherer
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1506-1507
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Cathodoluminescence in the Scanning Electron Microscope

Abstract

  • Local Stress Assessment in Patterned Interlayer Dielectric Films using Cathodoluminescence Spectroscopy

  • S Kakinuma, M Kodera, K Nishikata, J Aoyama, Y Saijo, G Pezzotti
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1508-1509
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Effects of Lithium Doping and Post-processing on the Cathodoluminescence of Zinc Oxide Nanoparticles

  • K McBean, M Phillips, D Drouin
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1510-1511
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • CASINO a Powerful Simulation Tool for Cathodoluminescence Applications

  • D Drouin
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1512-1513
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Combined SEM Electron-Beam-Induced Current and Cathodoluminescence Imaging and STEM Structural Analysis of GaN Light Emitting Diodes

  • CM Parish, CL Progl, ME Salmon, PE Russell
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1514-1515
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • A Cathodoluminescene (and Raman) Imaging and Spectroscopic Study of Ancient Polycrystalline Diamond

  • EP Vicenzi, T Rose, M Fries, A Steele, C Magee
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1518-1519
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Advances in Multi-Signal Spectrum-Image Acquisition and Data Extraction Techniques involving Spectral Cathodoluminescence

  • SA Galloway, PJ Thomas
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1520-1521
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Multivariate Statistical Analysis of Combined Hyperspectral Cathodoluminescence and X-Ray Datasets

  • PR Edwards, RW Martin, MR Lee
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1522-1523
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Page 38 of 45