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Report from the NIST-MAS-AMAS Roadmap Workshop on Variable Pressure Scanning Electron Microscopy/Environmental Scanning Electron Microscopy

Published online by Cambridge University Press:  31 July 2006

S Wight
Affiliation:
National Institute of Standards and Technology
D Newbury
Affiliation:
National Institute of Standards and Technology
B Griffin
Affiliation:
University of Western Australia

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Copyright
© 2006 Microscopy Society of America