Spectral Imaging and Multivariate Statistical Analysis from Thin Specimens in the SEM with a Four-Channel Silicon Drift Detector

PG Kotula; JR Michael

doi:10.1017/S1431927606066955

Spectral Imaging and Multivariate Statistical Analysis from Thin Specimens in the SEM with a Four-Channel Silicon Drift Detector

Published online by Cambridge University Press: 31 July 2006

PG Kotula and

JR Michael

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PG Kotula: Affiliation:
Sandia National Laboratories
JR Michael: Affiliation:
Sandia National Laboratories

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type: Abstract
Information: Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1390 - 1391

DOI: https://doi.org/10.1017/S1431927606066955 [Opens in a new window]

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Spectral Imaging and Multivariate Statistical Analysis from Thin Specimens in the SEM with a Four-Channel Silicon Drift Detector

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