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The Application of Micro Area Analysis of Al-Cu Junction by Wavelength-Dispersive EPMA Equipped with a FE Electron Gun.

Published online by Cambridge University Press:  31 July 2006

T Kimura ,
T Ogiwara ,
S Fukushima  and
S Tanuma
T Kimura
Affiliation:
National Institute for Materials Science,Japan
T Ogiwara
Affiliation:
National Institute for Materials Science,Japan
S Fukushima
Affiliation:
National Institute for Materials Science,Japan
S Tanuma
Affiliation:
National Institute for Materials Science,Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1420 - 1421
Copyright
© 2006 Microscopy Society of America