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Volume 12 - Issue S02 - August 2006

Contents

Page 42 of 45

Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Sciences

Abstract

  • Raman Microscopy Made Easy

  • T Tague, J Zhao
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1648-1649
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Microscopic Analysis of Raman Images of Pharmaceutical Products Using Point Mapping and Line Scanning Method

  • E Lee, F Adar, A Whitley
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1650-1651
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Hand-Sectioning and Analysis of Pharmaceutical Patches

  • M Stellmack, A Teetsov
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1652-1653
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Sampling Errors in Optical Microscope Measurements using Image Analysis

  • R Carlton
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1654-1655
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Dielectrophoretic Force Microscopy of Aqueous Interfaces

  • B Lynch, A Hilton, C Dorege, G Simpson
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1656-1657
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Probing the Solid-State Chemistry of Molecular Crystals

  • JA Reffner, PE Leary
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1658-1659
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Contamination Control in Electron and Ion Microscopy

Abstract

  • What EBID Can Tell Us About Contamination ?

  • DC Joy
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1660-1661
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Immobilization and Removal of Hydrocarbon Contamination Using the Evactron De-Contaminator

  • R Vane
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1662-1663
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Characterization of a Plasma Cleaner for Electron Microscopy

  • ST Coyle
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1664-1665
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Digital Imaging and Measurements

Abstract

  • 3D Measurements of Wear on Machining Tools Using a Confocal Microscope

  • S Huq, B Abidi, C Kammerud, D Page, M Abidi, J Frafjord, S Dekanich
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1666-1667
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Simulating Shot Noise in Electron Holograms -- Recorded Digitally

  • E Voelkl
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1668-1669
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Exit Wave Function Retrieval from Diffraction Patterns with Variable SAED Aperture

  • V Volkov, J Wall, Y Zhu
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1670-1671
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Recent Developments in Reliable and Reproducible Digital Immunogold Analysis in Electron Microscopy

  • J Krieger, M Bartels, W-J Chen, M Bode
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1674-1675
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Fluorescence Dot Counting Efficiency in Radiance Mapped Images

  • S Shah, F Merchant
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1676-1677
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Calibrating Multispectral Imaging Sytem for Biological Particle Analysis under Transmitted Illumination

  • J Thigpen, S Shah, F Merchant
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1678-1679
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Stress Whitening Morphology of Multiphase Polypropylene

  • S Westphal
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1680-1681
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Macro Techniques and Digital-Microscopy

  • LM Gammon
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1682-1683
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Image Analysis of Off-Eutectic Alloys with Lamellar Microstructures

  • D Susan, C Robino, J DuPont, M Minicozzi
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1684-1685
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Darkfield Brightfield and Energy-Filtered Nanotube Image Profiles

  • E Mandell, P Fraundorf, S Lin
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1686-1687
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Page 42 of 45