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Optimized Cs-corrected Imaging of Radiation-Sensitive High-Resolution Objects

Published online by Cambridge University Press:  31 July 2006

M Malac
Affiliation:
National Institute for Nanotechnology
M Beleggia
Affiliation:
Brookhaven National Laboratory
R Egerton
Affiliation:
University of Alberta
Y Zhu
Affiliation:
Brookhaven National Laboratory

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Copyright
© 2006 Microscopy Society of America