Microscopy and Microanalysis: Volume 20 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

X-ray Imaging

Abstract

X-Ray Microanalysis with High Spatial Resolution and High Counts Rate with a State of the Art Field Emission Scanning Electron Microscope

High Speed, High Resolution pnCCDs as Two Dimensional Imaging Spectrometers for X-rays and Electrons

Interactive Analysis of Terabyte-sized SEM-EDS Hyperspectral Images

Support Vector Machines for Classification and Quantitative Analysis

Comparison of Principal Component Analysis and Multivariate Curve Resolution-Alternating Least Squares Analysis of XPS Spectral Maps

How to Process Zillions of Spectra from Spectral Imaging Datasets? From Phase-Mapping to Bulk-Chemistry on Micron- to Centimeter Scale Using PARC

Need for Large-Area EDS Detectors for Imaging Nanoparticles in a SEM Operating in Transmission Mode

Mineral Classification Using Computer-Controlled Scanning Electron Microscopy

Quantitative Density Analysis of Ultra-Low Density Polymer Foams Using Various X-ray Imaging Techniques

Fluorescence Micro-tomography of Frozen-hydrated Whole Cells using the Bionanoprobe

X-ray Mapping Investigations of the Monazites from the Mt Weld Deposit - Compositional Variance as an Indicator of Provenance

In-situ Compression Imaging of Polymer Foams using Synchrotron X-ray Computed Tomography

The Use of a High-Resolution, High-Contrast X-ray Microscope to Probe the Internal Structure of Low Z Materials

X-ray Quantitative Microanalysis Maps across Interfaces of a Cu-Al Roll Bonded Laminate with an Annular Silicon Drift Detector

X-ray Mapping and Chemical Phase Mapping with an Amptek SDD

Frontiers of Electron-Probe Microanalysis

Abstract

Analytical Challenges and Strategies in FE-EPMA

Present State of TEM-SXES Analysis and its Application to SEM aiming Chemical Analysis of Bulk Materials

Exciting Possibilities of Soft X-ray Emission Spectroscopy as Chemical State Analysis in EPMA and FESEM

Recent Achievements of Electron Beam Deceleration Method for FE-SEM Enhanced Elemental Analysis including Soft X-ray Emission Spectroscopy

Strategies for Low Accelerating Voltage X-ray Microanalysis of Sub-Micrometer Features with the FE-EPMA

Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

X-ray Imaging

Abstract

Frontiers of Electron-Probe Microanalysis

Abstract