Microscopy and Microanalysis: Volume 20 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

3D Imaging and Microanalysis: Image Analysis and Applications

Abstract

Data Processing Challenges for Proper Interpretation of FIB-SEM Nanotomography Imaging Applications

Optimization of Focused Ion Beam-Tomography for Superconducting Electronics

Accelerating Discovery in 3D Microanalysis: Leveraging Open Source Software and Deskside High Performance Computing

The Use of NanoComputed Tomography to Enhance Musculoskeletal Research

Subsurface Particle Analysis using X-ray Computed Tomography and Confocal Xray Fluorescence

Multi-scale Imaging of Al-7at.%Cu Eutectics using Micro- and Nano-scale X-ray Computed Tomography

Nano-Dot Markers for Electron Tomography Formed by Electron Beam-Induced Deposition: Nanoparticle Agglomerates Application

3D Nanoscale Analysis of Zeolite Catalysts by Electron Tomography and Image Processing

TFS: Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy

Optimization of the Data Acquisition and Processing using a Prior Knowledge of the Camera Characteristics: an EFTEM Case Study

Monte Carlo Simulation and Experimental High-Angle Annular Dark Field Tomography

The Phantom in the Noise and Validation of 3D EM Reconstructions

Advanced 3-D Reconstruction Algorithms for Electron Tomography

Compressed Sensing, Sparsity, and the Reliability of Tomographic Reconstructions

3D EDS Applications Using Destructive and Non-Destructive FIB-Based Techniques

Time-Resolved 3D Imaging of Ion Beam Induced Surface Damage in Gold Nanoparticles

Model-based Iterative Reconstruction for Low-dose Electron Tomography

Atomic Resolution Tomography of Magnetically Anisotropic FePt Nanoparticles

Electron Diffraction Based Tilt Angle Measurements in Electron Tomography

A Model Based Method for Tomographic Reconstructions of Nanoparticle Assemblies

Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

3D Imaging and Microanalysis: Image Analysis and Applications

Abstract