Microscopy and Microanalysis: Volume 20 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Practical Applications and Analytical Trends of Metallography and Microstructure

Abstract

Phase Identification by EBSD Analysis of Non-Metallic Crystallites

Analysis of Titanium Microalloying in As-Received and Oxidized Crofer® 22 APU

Effect of a Coating Induced Residual Stress on Magnetic Domain Structure in Non-Oriented Electrical Steels

Advances in Cathodoluminescence and Soft X-ray Microanalysis

Abstract

Valence Electron States of Carbon Materials studied by TEM-SXES

Development of Soft X-ray Microanalysis using Windowless SDD Technology

Using Accurate Solid Angle Tools when Comparing EDS Detector Geometries

Mapping of Weak Cathodoluminescence Signals

Cathodoluminescence Spectra Acquisition Using an Imaging Spectrograph and CCD Detector: Materials Characterization Using Trivalent REE Doped Synthetic and Natural Materials

Cathodoluminescence Hyperspectral Imaging of Nitride Semiconductors: Introducing New Variables

Zircon Metamictisation study by Cathodoluminescence and X-ray Imaging

Cathodoluminescence Microanalysis of Amorphised Quartz

Novel Cathodoluminescence Detector with Extremely Large Field of View

Quartz Overgrowths in Shales and Sandstones studied by EPMA and SIMS

Luminescence database - an update

The Present State of Chemical State Analysis in EPMA and WD-SXES

Cathodoluminescence and DART Mass Spectrometry for the Forensic Identification of Explosive and Narcotic Particle Residues on Surfaces

Cs-Correctors: Current State and Ongoing Developments

Abstract

Lifetime of Optical States in Transmission Electron Microscopy

Performance and Stability of Dedicated Aberration-Corrected STEMs: a User's Perspective

On Proper Phase Contrast Imaging in Aberration Corrected TEM

Tuning High Order Geometric Aberrations in Quadrupole-Octupole Correctors

Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Practical Applications and Analytical Trends of Metallography and Microstructure

Abstract

Advances in Cathodoluminescence and Soft X-ray Microanalysis

Abstract

Cs-Correctors: Current State and Ongoing Developments

Abstract