Advances in Instrumentation Symposia
Correlative Microscopy and Microanalysis from Macro to Pico
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Correlative Light and Electron Microscopy - on the Way from 2D Towards 3D
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- 27 August 2014, pp. 1010-1011
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New Preparation Method using Ionic Liquid for Fast and Reliable SEM Observation of Biological Specimens
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- 27 August 2014, pp. 1012-1013
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Investigation of Friction Wear Process in the Presence of Exfoliated Graphite Nanoparticles using Correlative in situ Raman Micro Spectrometry and Post Mortem Raman, Analytical Scanning and Transmission Electron Microscopies
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- 27 August 2014, pp. 1014-1015
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Ionic Liquid Preparation for SEM Observation of Minute Crustacean
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- 27 August 2014, pp. 1016-1017
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Development of High Pressure Freezing and Correlative Light/Electron Microscopy for Drosophila Larvae
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- 27 August 2014, pp. 1018-1019
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Extended Crystal Defects: Quantification of Strain, Local Atomic Structure and Chemistry
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Imaging Extended Defects by TEM
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- 27 August 2014, pp. 1020-1021
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Towards a Uniform Model for Lattice Defect Image Simulations
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- 27 August 2014, pp. 1022-1023
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Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors
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- 27 August 2014, pp. 1024-1025
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Metadislocations in Complex Metallic Alloys
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- 27 August 2014, pp. 1026-1027
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Sub-nanometer Resolution Chemi-STEM EDS Mapping of Superlattice Intrinsic Stacking Faults in Co-based Superalloys
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- 27 August 2014, pp. 1028-1029
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Using Bethe Potentials in the Scattering Matrix for Defect Image Simulations
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- 27 August 2014, pp. 1030-1031
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STEM-Based Characterization of Dislocations and Stacking Faults in Structural Materials
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- 27 August 2014, pp. 1032-1033
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Polar Oxide Interface Characterization by Differential Phase Contrast STEM
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- 27 August 2014, pp. 1034-1035
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Defect Analysis in La0.7Sr0.3MnO3 Epitaxial Thin Films by Electron Channeling Contrast Imaging (ECCI)
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- 27 August 2014, pp. 1036-1037
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Toward 3D Mapping of Octahedral Rotations at Perovskite Thin Film Heterointerfaces Unit Cell by Unit Cell
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- 27 August 2014, pp. 1038-1039
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Chemical and Defect Analysis in a ZrO2/LSMO Pillar-Matrix System
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- 27 August 2014, pp. 1040-1041
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Atomic-Resolution Investigation of Irradiation-Induced Defects in Silicon Carbide
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- 27 August 2014, pp. 1042-1043
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Local Strain Measurements at Dislocations, Disclinations and Domain Boundaries
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- 27 August 2014, pp. 1044-1045
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Nano-scale Strain Mapping Using Advanced STEM with a Direct Electron Detector
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- 27 August 2014, pp. 1046-1047
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Measuring Strain Fields surrounding Grain-Boundary Dislocations in Silicon using Scanning Transmission Electron Microscopy
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- 27 August 2014, pp. 1048-1049
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