Microscopy and Microanalysis: Volume 20 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Correlative Microscopy and Microanalysis from Macro to Pico

Abstract

Correlative Light and Electron Microscopy - on the Way from 2D Towards 3D

New Preparation Method using Ionic Liquid for Fast and Reliable SEM Observation of Biological Specimens

Investigation of Friction Wear Process in the Presence of Exfoliated Graphite Nanoparticles using Correlative in situ Raman Micro Spectrometry and Post Mortem Raman, Analytical Scanning and Transmission Electron Microscopies

Ionic Liquid Preparation for SEM Observation of Minute Crustacean

Development of High Pressure Freezing and Correlative Light/Electron Microscopy for Drosophila Larvae

Extended Crystal Defects: Quantification of Strain, Local Atomic Structure and Chemistry

Abstract

Imaging Extended Defects by TEM

Towards a Uniform Model for Lattice Defect Image Simulations

Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors

Metadislocations in Complex Metallic Alloys

Sub-nanometer Resolution Chemi-STEM EDS Mapping of Superlattice Intrinsic Stacking Faults in Co-based Superalloys

Using Bethe Potentials in the Scattering Matrix for Defect Image Simulations

STEM-Based Characterization of Dislocations and Stacking Faults in Structural Materials

Polar Oxide Interface Characterization by Differential Phase Contrast STEM

Defect Analysis in La0.7Sr0.3MnO3 Epitaxial Thin Films by Electron Channeling Contrast Imaging (ECCI)

Toward 3D Mapping of Octahedral Rotations at Perovskite Thin Film Heterointerfaces Unit Cell by Unit Cell

Chemical and Defect Analysis in a ZrO2/LSMO Pillar-Matrix System

Atomic-Resolution Investigation of Irradiation-Induced Defects in Silicon Carbide

Local Strain Measurements at Dislocations, Disclinations and Domain Boundaries

Nano-scale Strain Mapping Using Advanced STEM with a Direct Electron Detector

Measuring Strain Fields surrounding Grain-Boundary Dislocations in Silicon using Scanning Transmission Electron Microscopy

Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Correlative Microscopy and Microanalysis from Macro to Pico

Abstract

Extended Crystal Defects: Quantification of Strain, Local Atomic Structure and Chemistry

Abstract