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Sub-nanometer Resolution Chemi-STEM EDS Mapping of Superlattice Intrinsic Stacking Faults in Co-based Superalloys

Published online by Cambridge University Press:  27 August 2014

Michael S. Titus ,
Akane Suzuki ,
Michael J. Mills  and
Tresa M. Pollock
Michael S. Titus
Affiliation:
University of California, Santa Barbara, Materials Department, Santa Barbara, CA, USA
Akane Suzuki
Affiliation:
GE Global Research Center, Schenectady, NY, USA
Michael J. Mills
Affiliation:
The Ohio State University, Department of Materials Science and Engineering, Columbus, OH, USA
Tresa M. Pollock
Affiliation:
University of California, Santa Barbara, Materials Department, Santa Barbara, CA, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1028 - 1029
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Sato, J, Omori, Τ, Oikawa, K, Ohnuma, I, Kainuma, R, Ishida, K Science 312 (2006), p. 90.Google Scholar
[2] Pollock, TM, Dibbern, J, Tsunekane, M, Zhu, J, Suzuki, A JOM 62 (2010), p. 58.Google Scholar
[3] Tsunekane, M, Suzuki, A, Pollock, TM Intermet 19 (2011), p. 636.Google Scholar
[4] Titus, MS, Suzuki, A, Pollock, TM Acta Mater 56 (2012), p. 1288.Google Scholar
[5] Titus, MS, et al, Superalloys 2012 (2012)p. 823.Google Scholar
[6] Voronstov, VA, Kovarik, L, Mills, MJ, Rae, CMF Acta Mater 60 (2012), p. 4866.Google Scholar
[7] The authors acknowledge funding from NSF DMREF Grant DMR 1233704 and General Electric.Google Scholar