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Measuring Strain Fields surrounding Grain-Boundary Dislocations in Silicon using Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  27 August 2014

Martin Couillard
Martin Couillard*
Affiliation:
National Research Council Canada, Energy, Mining and Environment Portfolio, 1200 Montreal rd., Ottawa ON, K1A0R6, Canada

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1048 - 1049
Copyright
Copyright © Microscopy Society of America 2014 

References

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[5] Couillard, M., Radtke, G. and Botton, G.A. Phil. Mag 93 (2013), p. 1250.Google Scholar