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STEM-Based Characterization of Dislocations and Stacking Faults in Structural Materials

Published online by Cambridge University Press:  27 August 2014

T. L. Smith ,
M. L. Bowers ,
M. De Graef  and
M.J. Mills
T. L. Smith
Affiliation:
Department of Materials Science and Engineering, Center for Electron Microscopy and Analysis (CEMAS), The Ohio State University, Columbus OH 43210
M. L. Bowers
Affiliation:
Department of Materials Science and Engineering, Center for Electron Microscopy and Analysis (CEMAS), The Ohio State University, Columbus OH 43210
M. De Graef
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh PA 15213
M.J. Mills
Affiliation:
Department of Materials Science and Engineering, Center for Electron Microscopy and Analysis (CEMAS), The Ohio State University, Columbus OH 43210

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1032 - 1033
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Phillips, P.J., Mills, M.J. & Graef, M. De Philosophical Magazine 91 (2011). p. 2081.Google Scholar
[2] Phillips, P.J., Brandes, M.C., Mills, M.J. & Graef, M. De Ultramicroscopy 111 (2011). p. 1483.Google Scholar
[3] Phillips, P.J., De Graef, M., Kovarik, L., Agrawal, A., Windl, W. & Mills, M.J. Ultramicroscopy, 116 (2012). p. 47.Google Scholar
[4] Support of the National Science Foundation, Division of Materials Research, under the GOALI program DMR-0907561 is gratefully acknowledged by MB and MJM.Google Scholar