Microscopy and Microanalysis: Volume 20 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Extended Crystal Defects: Quantification of Strain, Local Atomic Structure and Chemistry

Abstract

Direct Lattice Parameter Measurements Using HAADF-STEM

Quantitative Strain Measurement in Semiconductor Devices by Scanning Moiré Fringe Imaging

Column-by-Column Imaging of Dislocation Slip Processes in CdTe

Statistical Characterization of High Angle Graphene Grain Boundaries at Atomic Resolution

Atomic Imaging Across Strain Boundaries in Bilayer Graphene with ADF-STEM and DF-TEM

Experimental Evidence of Chiral Gold Nanowires with Boerdijk-Coxeter-Bernal Structure by Atomic-Resolution Imaging

Three-Dimensional Imaging of Dislocations and Defects in Materials at Atomic Resolution Using Electron Tomography

Electron Channeling Contrast Imaging for Non-Destructive Analysis of Extended Defects in Semiconductor Thin Films and Device Structures

Applications of Automated High Resolution Strain Mapping in TEM on the Study of Strain Distribution in MOSFETs

Accuracy of Strain in Strain Maps Improved by Averaging Multiple Maps

Strain Quantification Analysis of Epitaxial SiGe on SOI by Nanobeam Diffraction (NBD)

Measurement of Local Atomic Displacements Reveals Interaction of Au Nanocrystals with Rutile (TiO2) Surface Steps

Atomic Resolution Study of Local Strains in Doped VO2 Nanowires

Strain Associated with Surface-Penetrating Dislocations Visible by Electron Channeling Contrast Imaging

Ad Hoc Determination of Local Misorientations and Boundary Planes between Grains in TEM by a Dedicated Software Package Developed for the Gatan DigitalMicrograph Platform

Investigation of Bi Segregation of Cu Bicrystal Boundaries Using Aberration-Corrected STEM Depth Sectioning

Observations on Heavily Deformed Tantalum

Atomic-scale Observation of Grains and Grain Boundaries in Monolayers of WS2

Imaging Defects in Quantum Materials

An Electron Microscopic Investigation of (1/3) < 0ī11 > Dislocations in Bi2Te3 Nanowires: Defect Crystallography and Relationship to 7-layer Bi3Te4 Defects.

Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Extended Crystal Defects: Quantification of Strain, Local Atomic Structure and Chemistry

Abstract