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Imaging Defects in Quantum Materials

Published online by Cambridge University Press:  27 August 2014

David C. Bell  and
Estelle Kalfon-Cohen
David C. Bell
Affiliation:
School of Engineering and Applied Sciences, Harvard University, Cambridge, MA 02138
Estelle Kalfon-Cohen
Affiliation:
School of Engineering and Applied Sciences, Harvard University, Cambridge, MA 02138

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1086 - 1087
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Reina, A., Jia, X., Ho, J., Nezich, D., Son, H., Bulovic, V., Dresselhaus, M.S. & Kong, J. Nano Lett. 9, 30–35 (2008).Google Scholar
[2] Kim, K.S., Zhao, Y., Jang, H., Lee, S.Y., Kim, J.M., Kim, K.S., Ahn, J.H., Kim, P., Choi, J.Y. & Hong, B.H. Nature 457, 706–710 (2009).Google Scholar
[3] This work was supported by the STC Center for Integrated Quantum Materials, NSF Grant No. DMR-1231319.Google Scholar