Microscopy and Microanalysis: Volume 20 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Vendor Symposium: New Tools for Life and Materials Sciences

Abstract

Applications and Design of Reinforced Silicon Nitride Windows for In Situ Liquid Transmission Electron Microscopy

TAG Lens: Revolutionizing Optical Microscopy With Ultra-High Speed Variable Focus

A Novel Compact Stand-alone FTIR Microscope for the Analysis of Small Samples

Rapid, High-Resolution Raman Imaging of Pharmaceutical, Biological, and Other Materials with the Thermo Scientific DXRxi.

The Unique Capabilities of Auger Electron Spectroscopy

Secondary Electron Imaging in the Helium Ion Microscope

Optimized Electron Column and Detection Scheme for Advanced Imaging and Analysis of Metals

New High-Resolution Low-Voltage and High Performance Analytical FIB/SEM System

Automated SEM Analysis in Industrial Process Control and Scientific Research

Using Nion Swift for Data Collection, Analysis and Display

Enabling Future Nanotomography and Nanofabrication with Crossbeam Technology

AFM Integrated with SEM/FIB for Complete 3D Metrology Measurements

Image Collection using an Auto Data Acquisition System and An Application to Ice embedded Ribosome

A New Microstructural Imaging Approach through EBSD Pattern Region of Interest Analysis

Concepts for an Annular Pole Piece Detector for the Simultaneous Measurement of X-Rays and Backscattered Electrons Inside a SEM

Performance Advances in LEAP systems

The pnCCD for Applications in Transmission Electron Microscopy: Further Development and New Operation Modes

Large Solid Angle Silicon Drift Detectors for EDX Analysis in TEM

Are EDS Specifications Still Relevant

Introduction of a New Conventional SEM: JSM-IT300LV:The Observation of a Water Containing Specimen With a Cooling Stage at 650 Pa

Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Vendor Symposium: New Tools for Life and Materials Sciences

Abstract