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Performance Advances in LEAP systems

Published online by Cambridge University Press:  27 August 2014

R.M. Ulfig ,
D.J. Larson ,
T.F. Kelly ,
P.H. Clifton ,
T.J. Prosa ,
D.R Lenz  and
E.X. Oltman
R.M. Ulfig
Affiliation:
CAMECA Instruments, Inc., 5500 Nobel Drive, Madison, WIUSA
D.J. Larson
Affiliation:
CAMECA Instruments, Inc., 5500 Nobel Drive, Madison, WIUSA
T.F. Kelly
Affiliation:
CAMECA Instruments, Inc., 5500 Nobel Drive, Madison, WIUSA
P.H. Clifton
Affiliation:
CAMECA Instruments, Inc., 5500 Nobel Drive, Madison, WIUSA
T.J. Prosa
Affiliation:
CAMECA Instruments, Inc., 5500 Nobel Drive, Madison, WIUSA
D.R Lenz
Affiliation:
CAMECA Instruments, Inc., 5500 Nobel Drive, Madison, WIUSA
E.X. Oltman
Affiliation:
CAMECA Instruments, Inc., 5500 Nobel Drive, Madison, WIUSA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1120 - 1121
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Larson, D.J., et al., “Local Electrode Atom Probe Tomography” (Springer, New York (2014) p. 318.Google Scholar
[2] Miller, M.K. Forbes, R.G. Materials Characterization 60 (2009) p. 461.Google Scholar
[3] Meisenkothen, F., et.al., Microsc and Microanal, 20(S2 (2014) these proceedings.Google Scholar