Microscopy and Microanalysis: Volume 20 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Correlative Microscopy and Microanalysis from Macro to Pico

Abstract

Correlative Microscopy Using TEM and SIMS: Parallel Ion Electron Spectrometry (PIES) for High-Resolution, High-Sensitivity Elemental Mapping for Applications in Materials Science and Biology

The Atmospheric Scanning Electron Microscope (ASEM) Observes Axonal Segmentation and Synaptic Induction in Solution

Correlative Imaging and Cryo-FIB Processing for Direct Visualization of HIV-1 Infection

Correlating Multiscale Measurements of Nanoparticles in Primary Cells

Observation of Tissues in Solution by Atmospheric Scanning Electron Microscope (ASEM)

The Strategy of Advanced Analysis in Semiconductor Nano-Device: From Nanoprobing to Nanoscopy and Nanoanalysis

Multi-scale EBSD and EDS for Detection and Analysis of Spatially Rare Grains and Phases

A Simplified Approach to Determining Resolution of Optical, Ion and Electron Microscope Images

X-ray Microscopy: The Cornerstone for Correlative Characterization Methods in Materials Research and Life Science

Multi-Scale Characterization of Different Generations of Gamma Prime Precipitates in Nickel-based Superalloys Using Correlative Microscopy Techniques

FIB-SEM Instrument with Integrated Raman Spectroscopy for Correlative Microscopy

Hybrid SEM/AFM System from Carl Zeiss Revolutionizes Analysis of Functional Micro- and Nanostructured Specimen

Correlative Compositional Analysis of Fiber-Optic Nanoparticles

Correlative Imaging of Stacking Faults using Atom Probe Tomography (APT) and Scanning Transmission Electron Microscopy (STEM)

Understanding Fayalite Chemistry using Electron Microscopy and Atom Probe Tomography

Beware of Artifacts When Characterizing Nanometer Device Features Smaller than a TEM Lamella Thickness in Semiconductor Wafer-foundries

Comprehensive Nanofabrication by Correlating Crossbeam and ORION Nanofab

A Streamlined Technique to Examine Cell Monolayers by means of Correlative Light and Transmission Electron Microscopy

The SECOM Platform: an Integrated CLEM Solution

Combining Terapixel-Scale SEM Imaging and High-Resolution TEM Studies for Mineral Exploration.

Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Correlative Microscopy and Microanalysis from Macro to Pico

Abstract