Microscopy and Microanalysis: Volume 20 -

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 20 - August 2014

Advances in Instrumentation Symposia

Cs-Correctors: Current State and Ongoing Developments

Abstract

Applications of Aberration Corrected TEM and Exit Wavefunction Reconstruction to Materials Science

Off-Axial Aberration Correction using a B-COR for Lorentz and HREM Modes

Overview of Commercially Available CEOS Hexapole-type Aberration Correctors

Quantitative Assessment of Lower-Voltage TEM Performance Using 3D Fourier Transform of Through-Focus Series

Aberration-Corrected Transmission Electron Microscopy Reveals Nanoscale Disorder in Bismuth Ferrite Single Crystals

Atomically Resolved 3D Shape Determination of a MgO Crystal Using a Single Aberration Corrected HRTEM Image

Amplitude Contrast Imaging: High Resolution Electron Microscopy Using a Spherical and Chromatic Aberration Corrected TEM

A Need for Bandwidth Limitations in Electron Microscopes

Aberration-Corrected STEM by Means of Diffraction Gratings

Circumventing Scherzer's Theorem: Large Numerical Aperture Objective Lenses for Pulsed Electron Microscopy

The Real Structure of Cu3Ni2SbO6 and Cu3Co2SbO6 Delafossites with Honeycomb Lattices by Aberration-Corrected HRTEM

Correlative Microscopy and Microanalysis from Macro to Pico

Abstract

Characterization of Photovoltaics: From Cells Properties to Atoms

Understanding the High-Temperature Mechanical Properties of A710 (HSLA-80) Steel With Use of Complementary Atom Probe Tomography and Electron Microscopy

3D Microstructure Characterization and Analysis of Al-Si Foundry Alloys at Different Length Scales

Probing the Crystallography of Ordered Phases by coupling Orientation Microscopy and Atom Probe Tomography

Investigation of Possible Nucleation Mechanisms for Producing an Ultra-Refined Alpha Phase Microstructure in Beta Titanium Alloys Using High-Resolution Electron Microscopy and 3D Atom Probe Tomography

From Micro to Nano: Correlative 3D Microscopies for Analysis of Biointerfaces

Investigating the Effects of a Heat Treatment on Microstructure of an Ultrahigh Carbon Steel through SEM and In Situ CLSM studies

SIMS Based Correlative Microscopy for High-Resolution High-Sensitivity Nano-Analytics

In-situ EM Characterization of Li-ion Battery through Multiple Cycles

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 20 - August 2014

Advances in Instrumentation Symposia

Cs-Correctors: Current State and Ongoing Developments

Abstract

Correlative Microscopy and Microanalysis from Macro to Pico

Abstract