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X-ray Microscopy: The Cornerstone for Correlative Characterization Methods in Materials Research and Life Science

Published online by Cambridge University Press:  27 August 2014

Arno P. Merkle ,
Jeff Gelb ,
Alexander Orchowski  and
Jochen Fuchs
Arno P. Merkle
Affiliation:
Carl Zeiss X-ray Microscopy, Inc., Pleasanton, CA USA
Jeff Gelb
Affiliation:
Carl Zeiss X-ray Microscopy, Inc., Pleasanton, CA USA
Alexander Orchowski
Affiliation:
Carl Zeiss Microscopy GmbH, Oberkochen, Germany
Jochen Fuchs
Affiliation:
Carl Zeiss AG, Oberkochen, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 986 - 987
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Merkle, A. P.and Gelb, J. Ascent of 3D X-ray Microscopy in the Laboratory, Microscopy Today, 21 (2013), p. 10.Google Scholar
[2] Maire, E and Withers, P Quantitative X-ray tomography, International Materials Review, 59 (2014p. 1.Google Scholar
[3] Handschuh, S, et al., Frontiers in Zoology, 10 (2013), p. 44.Google Scholar