Hostname: page-component-77c89778f8-m42fx Total loading time: 0 Render date: 2024-07-18T23:21:00.854Z Has data issue: false hasContentIssue false
  • English
  • Français

Development of Soft X-ray Microanalysis using Windowless SDD Technology

Published online by Cambridge University Press:  27 August 2014

S. Burgess ,
X. Li ,
J. Holland ,
P. Statham ,
S. Bhadare ,
D. Birtwistle  and
A. Protheroe

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 898 - 899
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Terauchi, M., et al. (2011) Journal of Electron Microscopy, 61 (1), 1– 8.Google Scholar
[2] Burgess, S., et al. (2013) Microscopy and Analysis, 27 (4), S8-S13. (EU).Google Scholar