On Proper Phase Contrast Imaging in Aberration Corrected TEM

Peter Hartel; Martin Linck; Frank Kahl; Heiko Müller; Max Haider

doi:10.1017/S1431927614006357

On Proper Phase Contrast Imaging in Aberration Corrected TEM

Published online by Cambridge University Press: 27 August 2014

Peter Hartel ,

Martin Linck ,

Frank Kahl ,

Heiko Müller and

Max Haider

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Type: Abstract
Information: Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 926 - 927

DOI: https://doi.org/10.1017/S1431927614006357 [Opens in a new window]

References

[1] Haider, M. et al, Nature 392 (1998), 768-769.Google Scholar

[2] Scherzer, O. Ber. Bunsen-Gesellschaft phys. Chemie 74 (1970), 1154-1167.Google Scholar

[3] Lentzen, M. Microsc. Microanal., 14, (2008), 16-26.Google Scholar

[4] Born, M., Wolf, E. Principles of Optics, 6^th edition (Cambridge university press, Cambridge), p. 468.Google Scholar

[5] SALVE, II project, <http://www.salve-project.de>..>Google Scholar

Article contents

On Proper Phase Contrast Imaging in Aberration Corrected TEM

Abstract

References

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