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Performance and Stability of Dedicated Aberration-Corrected STEMs: a User's Perspective

Published online by Cambridge University Press:  27 August 2014

D.M. Kepaptsoglou ,
A.R. Lupini ,
D. Mücke-Herzberg ,
G. Vaughan  and
Q.M. Ramasse
D.M. Kepaptsoglou
Affiliation:
SuperSTEM Laboratory, STFC Daresbury Campus, Daresbury, United Kingdom
A.R. Lupini
Affiliation:
Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, U.S.A
D. Mücke-Herzberg
Affiliation:
SuperSTEM Laboratory, STFC Daresbury Campus, Daresbury, United Kingdom
G. Vaughan
Affiliation:
SuperSTEM Laboratory, STFC Daresbury Campus, Daresbury, United Kingdom
Q.M. Ramasse
Affiliation:
SuperSTEM Laboratory, STFC Daresbury Campus, Daresbury, United Kingdom

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 924 - 925
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Bell, D. C., Russo, C. J., and Benner, G. Microsc Microanal 16, 386 (2010).Google Scholar
[2] Muller, A. and Grazul, J. J Electron Microsc 50 , 219 (2001).Google Scholar
[3] Muller, D. A., Kirkland, E. J., Thomas, M. G., et al., Ultramicroscopy 106, 1033 (2006).Google Scholar
[4] Barthel, J.and Thust, A. Ultramicroscopy 134, 6 (2013).Google Scholar
[5] SuperSTEM is the UK National Facility of aberration corrected STEM, funded by the EPSRC.Google Scholar