Microscopy and Microanalysis: Volume 20 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Frontiers of Electron-Probe Microanalysis

Abstract

Progress towards Accurate Quantitative Standardless X-ray Analysis at Low kV

Comparative Performance of SDD-EDS and WDS Detectors for Quantitative Analysis of Mineral Specimens: The Next Generation Electron Microprobe

Comparison of SEM-EDS and EPMA-WDS Analysis of Rare Earth Element Containing Minerals from Bokan Mountain, Alaska

Standardless Analysis - Better but Still Risky

Soft X-Ray EPMA Analyses of Extremely Reduced Phases from Apollo 16 Regolith: Problems and Solutions for Sub-Micron Analysis

Towards Reliable Quantification of Steel Alloys at Low Voltage

Quantitative X-ray Microanalysis of Low Atomic Number Elements by SEM/SDD-EDS with NIST DTSA II: Carbides and Nitrides and Oxides, Oh My!

Importance of Carbon Contamination in High-Resolution (FEG) EPMA of Silicate Minerals

Quantitative Analysis Using Asymmetric Adaptive Pulse Processing

Application of Monte Carlo Calculations to Improve Quantitative Electron Probe Microanalysis

Compositional Mapping by EPMA and µXRF

Spectrum-based Phase Mapping of Apatite and Zoned Monazite Grains Using Principal Component Analysis

Using Electron-Probe Microanalysis and Quantitative Compositional Mapping to Study Lithic Clasts in Lunar Meteorites NWA 2727 and NWA 3170

Interdisciplinary X-Ray Microanalysis: From Planets and Comets to Artifacts and Fine Art

Determination of Trace Elements in Quartz by Combined EPMA and CL Microspectrometry

Trace Element Analyses by EMP: Pb-in-Monazite and New Multipoint Background Method

Quantitative Electron-probe Microanalysis and WDS Background Measurement

A New EPMA Method For Fast Trace Element Analysis In Simple Matrices

What's Still Missing with the Fluorescence Corrections and Should We Care?

FEG-EPMA of Solid State Redox Sensors - the Effect of Secondary Fluorescence on Analytical Precision

Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Frontiers of Electron-Probe Microanalysis

Abstract