Hostname: page-component-77c89778f8-swr86 Total loading time: 0 Render date: 2024-07-17T02:35:19.852Z Has data issue: false hasContentIssue false
  • English
  • Français

Importance of Carbon Contamination in High-Resolution (FEG) EPMA of Silicate Minerals

Published online by Cambridge University Press:  27 August 2014

Ben Buse  and
Stuart Kearns

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 704 - 705
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Saunders, , et al, Chemical Geology 364 (2014), p. 20.Google Scholar
[2] Reed, SJB in “Electron Microprobe Analysis”, (Cambridge University Press, Cambridge).Google Scholar
[3] Bastin, GFand Heijligers, HJM in “Quantitative electron probe microanalysis of carbon in binary.Google Scholar
carbides”, Technical Report, (Eindhoven University of Technology, Eindhoven, Netherlands).Google Scholar
[4] Pinard, PT, et al, Microscopy and Microanalysis 19 (2013), p. 996.Google Scholar
[5] Waldo, RA Microbeam Analysis 23 (1988), p.310.Google Scholar
[6] Bastin, GFand Heijligers, HJM Scanning 12 (1990), p. 225.Google Scholar