Microscopy and Microanalysis: Volume 20 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Frontiers in Analytical TEM-STEM

Abstract

Quantitative EDX and EELS Elemental Mapping at Atomic Resolution

Nano-Characterization of Emerging Photovoltaic Materials and Devices

Abstract

From Quantum Confinement to Quantum Electrodynamics using nanoCathodoluminescence in a STEM

Tunable Plasmon and Optical Properties of Chalcogenide Nanoplates Using Monochromated Electron Energy Loss Spectroscopy

Attosecond Forces Imposed by Swift Electrons on Nanometer-Sized Metal Particles

Electron Energy Loss Spectroscopy and Localized Cathodoluminescence Characterization of GaN Quantum Discs

Plasmons of Hexamer and Pentamer Nanocavities Probed with Swift Electrons

Frontiers in Analytical TEM-STEM

Abstract

EELS and EFTEM Analysis of Biological Materials

Optical Sectioning with Atomic Resolution Spectroscopy

Atomic Column Elemental Mapping by STEM-Moire Method

Observing Plasmon Damping Effects of Metallic Adhesion Layers in E-Beam Synthesized Nanostructures Using STEM-EELS and Raman Spectroscopy

High Resolution Optical and Vibrational Spectroscopy with Low Loss EELS

The Role of Cation Intermixing, Interfacial Chemistry, and Oxygen Deficiency in Understanding the Properties of the LaFeO3/SrTiO3(100) Interface

Methods for Scanning Transmission Electron Microscopy High Angle Annular Dark Field Based for Three Dimensional Analysis of the Local Composition in Solid Alloys

Structure Analysis of a Hyper-Complex Approximant to Icosahedral Quasicrystal using 3D Electron Diffraction Tomography

Very Large Solid Angle Windowless SDD Applications for Nanostructure and Semiconductor Applications

Investigation of Surface Plasmon Coupling and Damping in Au and Ag Nanoparticle Assemblies by Monochromated Electron Energy Loss Spectroscopy

Electron-Energy Loss and Optical Spectroscopy of Hybrid Nanogap-Antennas on Different Substrates

Development of Two Steradian EDX System for the HD-2700 FE-STEM Equipped with Dual X-MaxN 100 TLE Large Area Windowless SDDs

Monochromator for Aberration-Corrected STEM

Performance of an Improved TEM SDD Detector

Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Frontiers in Analytical TEM-STEM

Abstract

Nano-Characterization of Emerging Photovoltaic Materials and Devices

Abstract

Frontiers in Analytical TEM-STEM

Abstract