Microscopy and Microanalysis: Volume 20 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Nano-Characterization of Emerging Photovoltaic Materials and Devices

Abstract

Interfaces and Extended Structural Defects in Chalcopyrite Thin-Film Solar Cells Studied by Transmission Electron Microscopy

Photoluminescence Imaging of Semiconductors

Probing Structure/Property Relationships of Ce-rich Oxygen Evolution Catalysts by Advanced Transmission Electron Microscopy

Atomic Resolution Characterization of Pt Based Bi-Metallic Nano-Catalysts Using Aberration Corrected STEM

Electron Energy-Loss Spectroscopic Imaging for Phase Detection in Organic Photovoltaics

Linking Processing Parameters and Morphological Development in Organic Photovoltaics by Energy-Filtered TEM Imaging of Model Multilayer Structures

Three-Dimensional Arrangement and Connectivity of Lead-Chalcogenide Nanoparticle Assemblies for Next Generation Photovoltaics

Effects of Focused-Ion-Beam Processing on Local Electrical Measurements of Inorganic Solar Cells

Duplex Nanostructured TiO2 Powder

Spatial Distribution of Light Scattering and Absorption Interactions with TiO2- Nanoparticles from Monte Carlo and Generalized-Multiparticle-Mie based Simulations for Dye-Sensitized Solar Cell Analysis and Optimization

Investigation of the Use of Stereo-Pair Data Sets in Electron Tomography Characterization of Organic-Based Solar Cells

Using Electron Channeling Contrast Imaging for Misfit Dislocation Characterization in Heteroepitaxial III-V/Si Thin Films

Microscopic Investigation of Mono-layer/Multi-layer self-assembled InAs QDs on GaAs1-xSbx/GaAs Composite Substrates for Photovoltaic Solar Cells

Frontiers in Analytical TEM-STEM

Abstract

Oxygen Vacancy Ordering: a Degree of Freedom that can Control the Structural, Electronic and Magnetic Properties of Transition-Metal Oxide Films

Energy-Filtered High-Angle Dark Field Mapping of Ultra-Light Elements

Observation of layer by layer graphitization of 4H-SiC, through atomic-EELS at low energy

Atomic-Scale STEM-EELS Characterization of the Chemistry of Structural Defects and Interfaces in Energy-Related Materials

XEDS in the AEM: Has Everything Thing That Can be Invented, Been Invented?

The Effect of Probe Correctors on the Analytical Results of Non-ideal Samples

Aberration-Corrected Four-Detector STEM-EDS Analysis of Embedded Nanoclusters

Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Nano-Characterization of Emerging Photovoltaic Materials and Devices

Abstract

Frontiers in Analytical TEM-STEM

Abstract