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Energy-Filtered High-Angle Dark Field Mapping of Ultra-Light Elements

Published online by Cambridge University Press:  27 August 2014

T.C. Lovejoy ,
N. Dellby ,
T. Aoki ,
G.J. Corbin ,
P. Hrncirik ,
Z.S. Szilagyi  and
O.L. Krivanek
T.C. Lovejoy
Affiliation:
Nion Co., 1102 8th St, Kirkland, WA 98033, USA
N. Dellby
Affiliation:
Nion Co., 1102 8th St, Kirkland, WA 98033, USA
T. Aoki
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, AZ 85287, USA
G.J. Corbin
Affiliation:
Nion Co., 1102 8th St, Kirkland, WA 98033, USA
P. Hrncirik
Affiliation:
Nion Co., 1102 8th St, Kirkland, WA 98033, USA
Z.S. Szilagyi
Affiliation:
Nion Co., 1102 8th St, Kirkland, WA 98033, USA
O.L. Krivanek
Affiliation:
Nion Co., 1102 8th St, Kirkland, WA 98033, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 558 - 559
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Krivanek, OL, et al., Microscopy 62 (2013) 3-21.Google Scholar
[2] Krivanek, OL, et al., Proceedings 2013 EMAG meeting, in print (2014).Google Scholar
[3] Krivanek, OL, et al., these proceedings (2014).Google Scholar
[4] We gratefully acknowledge the use of facilities within the LeRoy Eyring Center for Solid State Science at ASU, and grant DE-SC0007694.Google Scholar