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Observation of layer by layer graphitization of 4H-SiC, through atomic-EELS at low energy
Published online by Cambridge University Press: 27 August 2014
Abstract
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- Information
- Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 560 - 561
- Copyright
- Copyright © Microscopy Society of America 2014
References
[3] This work was performed at Beyondnano CNR-IMM, which is supported by the Italian Ministry of Education and Research (MIUR) under project Beyond-Nano (PON a3_00363).Google Scholar