Microscopy and Microanalysis: Volume 20 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Frontiers in Analytical TEM-STEM

Abstract

Beam Damage During Energy-Dispersive X-ray Spectroscopy of FePt Nanoparticles

A Comparison of Cross Section Formulas and their Effect on Calculated k-factors

Spatially resolved In and As distributions in InGaAs/GaP and InGaAs/GaAs quantum dot systems

Thermal Stability Study of Ni-Co Core-Shell Nanoparticles by in situ TEM

Comparison of Analysis Routines for EDS and EELS Spectrum Images of Electrical Contacts to Single-Walled Carbon Nanotubes

Monte Carlo Simulation of Electron Energy Loss Spectra of Group III-Nitride Nanoscale Semiconductors

STEM Tomography and Surface Plasmon Imaging of a Au-Pd Bi-metallic Nanorod with Exotic Morphology

Universal Scaling of Surface Plasmon Modes

TEM of Nanostructured Organic and Hybrid Materials for Photovoltaic and Battery Applications

Angle-resolved Valence EELS of a Single Crystal Gold Sample

Quantitative Structural Analysis of Nanoparticles Using Electron Pair Distribution Function (ePDF)

Characterization of Metal-doped Mn3O4 Particles by Scanning Transmission Electron Microscopy and Electron Energy Loss Spectroscopy

X-ray Imaging

Abstract

X-Ray Mapping Investigations of Salt Migration in Seeds through use of Window and Windowless Silicon Drift Detectors

Identification of New Lithic Clasts in Lunar Breccia 14305 by micro-CT and micro-XRF analysis

Ultra High Solid Angle EDS System Advanced STEM Analysis for FE-SEM

Large Area EDS Mapping: Automated Collection of High Resolution Elemental Maps For Post Acquisition Analysis

Multidimensional Data Sets - Presentation, Evaluation and Extraction

Mineral Analyses & Implications on the Dispersion of Bismuth in the Supergene Environment of Eastern Australia

Investigation of Multiple, Large Area EDS Detectors on an SEM Capable of Various Mounting Geometries for Optimal EDS Analysis

Characterization of Rare Earth Element Ores with High Spatial Resolution Scanning Electron Microscopy

Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Frontiers in Analytical TEM-STEM

Abstract

X-ray Imaging

Abstract