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Soft X-Ray EPMA Analyses of Extremely Reduced Phases from Apollo 16 Regolith: Problems and Solutions for Sub-Micron Analysis

Published online by Cambridge University Press:  27 August 2014

P. Gopon ,
J. Fournelle ,
P. Sobol ,
M. Spicuzza ,
P. Pinard ,
S. Richter ,
X. Llovet  and
J.W. Valley
P. Gopon
Affiliation:
Dept. of Geoscience, University of Wisconsin, Madison, Wisconsin 53706USA
J. Fournelle
Affiliation:
Dept. of Geoscience, University of Wisconsin, Madison, Wisconsin 53706USA
P. Sobol
Affiliation:
Dept. of Geoscience, University of Wisconsin, Madison, Wisconsin 53706USA
M. Spicuzza
Affiliation:
Dept. of Geoscience, University of Wisconsin, Madison, Wisconsin 53706USA
P. Pinard
Affiliation:
Gemeinschaftslabor für Electronenmikroskopie, RWTH 52074 Aachen, Germany
S. Richter
Affiliation:
Gemeinschaftslabor für Electronenmikroskopie, RWTH 52074 Aachen, Germany
X. Llovet
Affiliation:
CCiTUB, University of Barcelona, ES-08028 Barcelona, Spain
J.W. Valley
Affiliation:
Dept. of Geoscience, University of Wisconsin, Madison, Wisconsin 53706USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 698 - 699
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Spicuzza, M.J., et al.. (2011). 42nd Lunar and Planetary Science Conference (2011),16-17.Google Scholar
[2] Anand, M., et al.. (2004, Proc. of the Nat. Acad. of Sci. USA, v. 101, no. 18, 6847-51.Google Scholar
[3] Essene, E.J., Fisher, D.C. (1986, Science (New York, N.Y.), v. 234, no. 4773, 189-93.Google Scholar
[4] Rietmeijer, F., et al.. (2008, Meteoritics and Planetary Science, v. 1/2, 121-134.Google Scholar
[5] Bird, J. M., Weathers, M. S. (1975, Earth and Planetary Science Letters, 28(1), 51–64.Google Scholar
[6] Llovet, X., et al.. (2012, IOP Conference Series: Materials Science and Engineering.Google Scholar
[7] Sokaras, D., et al.. (2011, Physical Review A, v. 83, no. 5, 1-12.Google Scholar
[8] Gopon, P., et al.. (2013, Microscopy and Microanalysis, 19(6), 1698–1708.Google Scholar
[9] Nakashima, D., et al.. (2013, Earth and Planetary Science Letters, 379, 127–136.Google Scholar