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Compressed Sensing, Sparsity, and the Reliability of Tomographic Reconstructions

Published online by Cambridge University Press:  27 August 2014

Yi Jiang
Affiliation:
Department of Physics, Cornell University, Ithaca, NY 14853
Robert Hovden
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853
David A. Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853 Kavli Institute at Cornell for Nanoscale Science, Ithaca, New York 14853
Veit Elser
Affiliation:
Department of Physics, Cornell University, Ithaca, NY 14853
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Abstract

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Copyright © Microscopy Society of America 2014 

References

[1] Candès, E.J., Romberg, J., Tao, T. IEEE Trans. Inform. Theory 52 (2006), p. 489–509.
[2] Donoho, D. L. IEEE Trans. Inform. Theory 52 (2006), p. 1289–1306.
[3] Saghi, Z., et al, Nano letters, 11 (2011), p. 4666–4673.
[4] Goris, B., et al, Ultramicroscopy 113 (2012), p. 120–130.
[5] Jörgensen, J. S., et al, SIAM J. on Scientific Computing, Submitted.
[6] van den Berg, E., et al, SIAM J. on Scientific Computing 31 (2012), p. 890–912.
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