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High Speed, High Resolution pnCCDs as Two Dimensional Imaging Spectrometers for X-rays and Electrons

Published online by Cambridge University Press:  27 August 2014

H. Soltau ,
R. Hartmann ,
P. Holl ,
S. Ihle ,
H. Ryll ,
M. Huth ,
J. Schmidt ,
R. Eckhardt ,
M. Simson  and
J. Soltau
...Show all authors
H. Soltau
Affiliation:
PNDetector GmbH, Emil-Nolde-Str.10, D-81735 Munich, Germany
R. Hartmann
Affiliation:
PNSensor GmbH, Römerstr. 28, D-80803 Munich, Germany
P. Holl
Affiliation:
PNSensor GmbH, Römerstr. 28, D-80803 Munich, Germany
S. Ihle
Affiliation:
PNSensor GmbH, Römerstr. 28, D-80803 Munich, Germany
H. Ryll
Affiliation:
PNSensor GmbH, Römerstr. 28, D-80803 Munich, Germany
M. Huth
Affiliation:
PNSensor GmbH, Römerstr. 28, D-80803 Munich, Germany
J. Schmidt
Affiliation:
PNSensor GmbH, Römerstr. 28, D-80803 Munich, Germany
R. Eckhardt
Affiliation:
PNDetector GmbH, Emil-Nolde-Str.10, D-81735 Munich, Germany
M. Simson
Affiliation:
PNDetector GmbH, Emil-Nolde-Str.10, D-81735 Munich, Germany
J. Soltau
Affiliation:
PNDetector GmbH, Emil-Nolde-Str.10, D-81735 Munich, Germany
Ch. Thamm
Affiliation:
PNDetector GmbH, Emil-Nolde-Str.10, D-81735 Munich, Germany
L. Strüder
Affiliation:
PNSensor GmbH, Römerstr. 28, D-80803 Munich, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 652 - 653
Copyright
Copyright © Microscopy Society of America 2014