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Present State of TEM-SXES Analysis and its Application to SEM aiming Chemical Analysis of Bulk Materials

Published online by Cambridge University Press:  27 August 2014

M. Terauchi ,
H. Takahashi ,
N. Handa ,
T. Murano ,
M. Koike ,
T. Imazono ,
M. Koeda ,
T. Nagano ,
H. Sasai  and
Y. Oue
...Show all authors
M. Terauchi
Affiliation:
IMRAM, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
H. Takahashi
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan
N. Handa
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan
T. Murano
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan
M. Koike
Affiliation:
Quantum Beam Science Directorate, Japan Atomic Energy Agency, 8-1-7 Umemidai, Kizugawa, Kyoto 619-0215, Japan
T. Imazono
Affiliation:
Quantum Beam Science Directorate, Japan Atomic Energy Agency, 8-1-7 Umemidai, Kizugawa, Kyoto 619-0215, Japan
M. Koeda
Affiliation:
Device Department, SHIMADZU Corp., 1 Nishinokyo-Kuwabaracho, Nakagyo-ku, Kyoto 604-8511, Japan
T. Nagano
Affiliation:
Device Department, SHIMADZU Corp., 1 Nishinokyo-Kuwabaracho, Nakagyo-ku, Kyoto 604-8511, Japan
H. Sasai
Affiliation:
Device Department, SHIMADZU Corp., 1 Nishinokyo-Kuwabaracho, Nakagyo-ku, Kyoto 604-8511, Japan
Y. Oue
Affiliation:
Device Department, SHIMADZU Corp., 1 Nishinokyo-Kuwabaracho, Nakagyo-ku, Kyoto 604-8511, Japan
Z. Yonezawa
Affiliation:
Device Department, SHIMADZU Corp., 1 Nishinokyo-Kuwabaracho, Nakagyo-ku, Kyoto 604-8511, Japan
S. Kuramoto
Affiliation:
Device Department, SHIMADZU Corp., 1 Nishinokyo-Kuwabaracho, Nakagyo-ku, Kyoto 604-8511, Japan

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 682 - 683
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Terauchi, M, et al, Journal of Electron Microscopy 61 (2012), 1.Google Scholar
[2] Imazono, T, et al, Applied Optics 51 (2012), 2351.Google Scholar
[3] Terauchi, M, et al, Microscopy 62 (2013), 391.Google Scholar
[4] Terauchi, M in “Transmission Electron Microscopy Characterization of Nanomaterials”, ed.CSSR Kumar, (Springer-Verlag, Berlin Heidelberg) 284.Google Scholar
[5] Nueangnoraj, K, et al., CARBON 62 (2013), 455.Google Scholar
[6] Terauchi, M, et al, Microscopy and Microanalysis, accepted.Google Scholar