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X-ray Mapping and Chemical Phase Mapping with an Amptek SDD

Published online by Cambridge University Press:  27 August 2014

L. Moran ,
K. Moran  and
R. Wuhrer
L. Moran
Affiliation:
Moran Scientific Pty Ltd, Goulburn, NSW, Australia
K. Moran
Affiliation:
Moran Scientific Pty Ltd, Goulburn, NSW, Australia
R. Wuhrer
Affiliation:
Advanced Materials Characterisation Facility, University of Western Sydney, NSW 2751, Australia

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 678 - 679
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Moran, K. & Wuhrer, R. Mikrochimica Acta 2006).Google Scholar
[2] Wuhrer, R., Moran, K. & Moran, L. Materials Forum 30 2006).Google Scholar
[3] Moran, K. & Wuhrer, R. Mikrochimica Acta 155 2006), p. 59.Google Scholar
[4] Moran, K. & Wuhrer, R. Mikrochimica 155 2006), p. 209.Google Scholar
[5] Wuhrer, R., Moran, K. & Phillips, M. R. Microscopy and Microanalysis 14 (suppl 2) 2008), 1108CD.Google Scholar
[6] The authors would like to thank the Advanced Materials Characterisation Facility at the University of Western Sydney and Paul Huggett from Materials Solutions.Google Scholar