Instrumentation and Techniques
Quantitative Atom-Probe Tomography
Abstract
Backside Lift-Out Specimen Preparation: Reversing the Analysis Direction in Atom Probe Tomography
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 298-299
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Field Evaporation of Octadecanethiol
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 300-301
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A System for Simulation of Tip Evolution Under Field Evaporation
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 302-303
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Atom-probe Tomography of Surface Oxides in a 20% Cold Worked Stainless Steel Tested Under PWR Primary Water Conditions
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- 26 July 2009, pp. 304-305
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Quantitative Analysis of Cementite in Steel by Atom Probe Tomography
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- 26 July 2009, pp. 306-307
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Study of Compositional Gradients Across the γ/γ Interface in Ni-base Superalloys Using 3D Atom Probe Tomography
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- 26 July 2009, pp. 308-309
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Quantitative Femtosecond Laser Atom Probe Analysis of Rare Earth Magnets
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- 26 July 2009, pp. 310-311
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Focused Ion Beam (FIB) Science and Technology: Fundamental Interactions,Instrumentation and Applications
Abstract
The Hyperion™ Ion Probe for Next Generation FIB, SIMS and Nano-Ion, Implantation
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- 26 July 2009, pp. 312-313
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The Dual Challenges for FIBXTEM in the Era of sub-50nm Feature Sizes
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- 26 July 2009, pp. 314-315
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Fabirication of Fine Electron Biprism Filament by Focused-Ion-Beam Chemical-Vapor-Deposition
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- 26 July 2009, pp. 316-317
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Electron Beam Induced Deposition and Etching: Fundamentals, Challenges and Nanotechnology–based Applications
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- 26 July 2009, pp. 318-319
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Challenges and Opportunities for Focused Ion Beam Processing at the Nano-scale
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- 26 July 2009, pp. 320-321
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Applications for Argon in a Triple Beam
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 322-323
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Surface Area Determination of Metal Ceramic Composite by FIB Sectioning and BET Measurements
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- 26 July 2009, pp. 324-325
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Experimental Determination of Electron Inelastic Mean Free Path of Components in a Magnetic Read Head
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- 26 July 2009, pp. 326-327
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Focused Ion Beam as a Direct-write Mask Tool for Patterning Diamond
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- 26 July 2009, pp. 328-329
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Precision, Double XTEM Sample Preparation of Site Specific Si Nanowires
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- 26 July 2009, pp. 330-331
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Advantages of a Local Charge Compensation System for FIB/SEM Applications on Insulating Materials
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 332-333
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Backside TEM Sample Preparation With The Multi-Loader Flip-Stage
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 334-335
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Protective Carbon Deposition for Superior FIB Prepared (S)TEM Specimens
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- 26 July 2009, pp. 336-337
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