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Volume 15 - April 2009

Contents

Page 18 of 47

Instrumentation and Techniques

Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Sciences

Abstract

  • Material and Particle Analysis – the Microscopical Path

  • S Aldrich
  • Published online by Cambridge University Press:
    26 July 2009, pp. 378-379
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Characterization of Tablets with Defects Related to Material Sticking to Punch Faces During Pharmaceutical Manufacturing

  • A Vogt, J Neilly, W Dziki
  • Published online by Cambridge University Press:
    26 July 2009, pp. 380-381
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Comparison of SiLi and SDD Detectors for Pharmaceutical Applications

  • R Carlton
  • Published online by Cambridge University Press:
    26 July 2009, pp. 382-383
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Effects of Humidity Exposure on a Solid Dosage Form Dissolution Performance.

  • C Kemp, M Skibic
  • Published online by Cambridge University Press:
    26 July 2009, pp. 384-385
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Confocal Raman AFM Imaging of Pharmaceutical Samples

  • U Schmidt, A Jauss, T Dieing, F Vargas, O Hollricher
  • Published online by Cambridge University Press:
    26 July 2009, pp. 388-389
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Advances in Fluorescent Nanoprobes for Cellular and In Vivo Imaging

Abstract

  • Luminescent Qdots for Molecular Imaging and Traceable Drug Delivery

  • X Gao
  • Published online by Cambridge University Press:
    26 July 2009, pp. 390-391
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Engineering Semiconductor Quantum Dots for Cellular, Molecular, and In Vivo Imaging

  • AM Smith, SM Nie
  • Published online by Cambridge University Press:
    26 July 2009, pp. 392-393
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Self-Assembled Nanoparticles for Integrated Cancer Imaging and Therapy

  • H Duan
  • Published online by Cambridge University Press:
    26 July 2009, pp. 394-395
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Metals and Minerals and Microstructure: Applications and Advances of Electron Backscatter Diffraction (EBSD)

Abstract

  • Crystallographic Reconstruction Methods to Study Phase Transformations by EBSD

  • C Cayron
  • Published online by Cambridge University Press:
    26 July 2009, pp. 396-397
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Characterization of a High Strength Weld Metal for TRIP Steels Using EBSD and HAADF/STEM Imaging

  • B Narayanan, M Quintana, MJ Mills
  • Published online by Cambridge University Press:
    26 July 2009, pp. 398-399
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Misorientation Gradients by EBSD in Hot and Cold Deformed Alloys

  • T Zhai, X Jiang, X Jianhui, Z Qiang, W Wei
  • Published online by Cambridge University Press:
    26 July 2009, pp. 400-401
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Structure and Orientation Determination of Metal-Oxide Nanostructures by Electron Backscatter Diffraction

  • YN Picard, L Mazeina, S Maximenko, J Freitas, S Prokes, ME Twigg
  • Published online by Cambridge University Press:
    26 July 2009, pp. 402-403
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Study on the Formation of P Orientation in CC Al-Mn-Mg Alloy by EBSD Method

  • Q Zeng, T Zhai
  • Published online by Cambridge University Press:
    26 July 2009, pp. 404-405
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A 3D EBSD Investigation of Dynamic Recrystallisation in a Cu-Sn Bronze

  • A Gholinia, I Brough, J Humphreys, D McDonald, P Bate
  • Published online by Cambridge University Press:
    26 July 2009, pp. 406-407
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Through-thickness Grain Structure of Metal-oxide Films Using EBSD

  • DM Feldmann
  • Published online by Cambridge University Press:
    26 July 2009, pp. 408-409
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Low Energy, Low Angle, Large Area Ion Polishing for Improved EBSD Indexing

  • S Walck, J Porter, H-W Yang
  • Published online by Cambridge University Press:
    26 July 2009, pp. 410-411
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Microstructure Evolution During Creep and Annealing of Minerals and Rocks

  • E Mariani, DJ Prior, SJ Covey-Crump, J Mecklenburgh, D Tatham, J Wheeler
  • Published online by Cambridge University Press:
    26 July 2009, pp. 412-413
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Information Depth and Kikuchi Band Contrast in Electron Backscatter Diffraction Patterns

  • A Winkelmann
  • Published online by Cambridge University Press:
    26 July 2009, pp. 414-415
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • High Resolution Surface Morphology Measurements using EBSD Cross-Correlation Techniques and AFM,

  • MD Vaudin, G Stan, YB Gerbig, RF Cook
  • Published online by Cambridge University Press:
    26 July 2009, pp. 416-417
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 18 of 47