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Volume 15 - April 2009

Contents

Page 20 of 47

Instrumentation and Techniques

Quantitative Analysis at the NanoScale - XEDS, EELS, SIMS, HAADF

Abstract

  • Single Atom Detection by XEDS in the Aberration Corrected AEM: Is it Feasible?,

  • NJ Zaluzec
  • Published online by Cambridge University Press:
    26 July 2009, pp. 458-459
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • What is the Best Beam Energy for X-Ray Microanalysis of Nanomaterials in Electron Microscopy?

  • R Gauvin, P Michaud, ML Trudeau
  • Published online by Cambridge University Press:
    26 July 2009, pp. 460-461
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Statistical Analysis of Point Defects in Hydrogen Storage Materials

  • MC Sarahan, QM Ramasse, DG Morgan, ND Browning
  • Published online by Cambridge University Press:
    26 July 2009, pp. 462-463
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Atomic Resolution Mapping Using Quantitative High-angle Annular Dark Field Scanning Transmission Electron Microscopy

  • S Van Aert, J Verbeeck, S Bals, R Erni, D Van Dyck, S Van Tendeloo
  • Published online by Cambridge University Press:
    26 July 2009, pp. 464-465
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Quantitative HAADF Imaging of Crystals Containing Heavy Elements: A Comparison with Theory

  • J LeBeau, S Findlay, X Wang, A Jacobson, L Allen, S Stemmer
  • Published online by Cambridge University Press:
    26 July 2009, pp. 466-467
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Crystal Structure Analysis Using Annular Dark-Field Imaging with High Precision

  • K Kimoto, K Ishizuka, M Saito, T Nagai, X Yu, R-J Xie, N Hirosaki, Y Matsui
  • Published online by Cambridge University Press:
    26 July 2009, pp. 468-469
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Atomic Resolution STEM and EELS Studies of Interfaces of Model Gold-Titanium Dioxide (Au-TiO2) Catalysts

  • S Sivaramakrishnan, J-G Wen, B Pierce, M Scarpelli, J-M Zuo
  • Published online by Cambridge University Press:
    26 July 2009, pp. 470-471
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Correlative Microscopy: Progress in Simultaneous Atomic-column XEDS and EELS, using a Monochromated, Aberration-corrected STEM

  • DC Bell, R Schillinger, S Meyer, P Tayebati
  • Published online by Cambridge University Press:
    26 July 2009, pp. 472-473
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • STEM in SEM For Medium-Resolution X-Ray Microanalysis

  • PG Kotula
  • Published online by Cambridge University Press:
    26 July 2009, pp. 474-475
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Three-dimensional Microanalysis Using FIB SEM: Variations in Technique

  • K Scott, JM Davis, EP Vicenzi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 476-477
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • 30 keV Ga+ FIB Induced X-Rays (FIBIX) of Conductive Materials

  • LA Giannuzzi, BP Gorman
  • Published online by Cambridge University Press:
    26 July 2009, pp. 478-479
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Fe Distribution in Zr-2.5Nb Pressure Tubes Having Variable Deformation Properties

  • ML Trudeau, AM Serventi, R Gauvin
  • Published online by Cambridge University Press:
    26 July 2009, pp. 482-483
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • The Exploration of Nanocomposition in Biphasic Polymer Nanocolloids Using a Multivariate Histogram Method Combined with Cryo-VEELS

  • G Kim, D Meyers
  • Published online by Cambridge University Press:
    26 July 2009, pp. 484-485
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Visualization and Simulation Optimization of PENELOPE through a Graphical Interface

  • PT Pinard, H Demers, F Salvat, R Gauvin
  • Published online by Cambridge University Press:
    26 July 2009, pp. 486-487
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • MC X-Ray, a New Monte Carlo Program for Quantitative X-Ray Microanalysis of Real Materials

  • R Gauvin, P Michaud
  • Published online by Cambridge University Press:
    26 July 2009, pp. 488-489
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Low-loss Energy-filtered Transmission Electron Microscopy for Imaging and Analysis of Nanoparticles

  • A Merkle, S Pokrant, S Irsen
  • Published online by Cambridge University Press:
    26 July 2009, pp. 490-491
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Characterization of Electrodeposited Copper Films with Time-of-Flight SIMS

  • H Demers, U Emekli, E Lifshin, AC West
  • Published online by Cambridge University Press:
    26 July 2009, pp. 492-493
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Position Averaged Convergent Beam Electron Diffraction

  • J LeBeau, S Findlay, L Allen, S Stemmer
  • Published online by Cambridge University Press:
    26 July 2009, pp. 494-495
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Failure Analyses: Practical Metallography/Fractography in Case Studies

Abstract

  • Failure Analysis Problem Solving Using Metallography

  • F Hogue
  • Published online by Cambridge University Press:
    26 July 2009, pp. 496-497
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 20 of 47