Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
  1. Home
  2. Journals
  3. Microscopy and Microanalysis
  4. Volume 15
Journal Home
Refine listing

Refine listing

Access:
Publication date:
Topic: Show more

Actions for selected content:

Select all | Deselect all
  • View selected items
  • Export citations
  • Download PDF (zip)
  • Save to Kindle
  • Save to Dropbox
  • Save to Google Drive

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Please provide a title, maximum of 40 characters.
Cancel
×
< Back to all issues

Volume 15 - April 2009

Contents

Page 17 of 47

Instrumentation and Techniques

Focused Ion Beam (FIB) Science and Technology: Fundamental Interactions,Instrumentation and Applications

Abstract

  • Dislocation Analysis of Semiconductor Devices using 3D Rotation Imaging Technique of Dedicated STEM

  • TS Back, SJ Lee, JW Jung, JH Kim, HJ Kim
  • Published online by Cambridge University Press:
    26 July 2009, pp. 338-339
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Standard Free Thickness Determination of Thin TEM Samples via Backscatter Electron Image Correlation

  • R Salzer, A Graff, M Simon, F Altmann
  • Published online by Cambridge University Press:
    26 July 2009, pp. 340-341
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Applications of SEM/FIB Technology in Life Science

  • A Schertel, D Kraft, M Rauscher
  • Published online by Cambridge University Press:
    26 July 2009, pp. 344-345
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Focused Ion Beam-based Three Dimensional Analysis of Optic Nerve Axons

  • A Avishai, X Yin, B Trapp, G Kidd
  • Published online by Cambridge University Press:
    26 July 2009, pp. 346-347
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Nanomilling for Aberration – Corrected TEM and HAADF STEM

  • RR Cerchiara, PE Fischione, J Liu, JM Matesa, AC Robins, HL Fraser, A Genc
  • Published online by Cambridge University Press:
    26 July 2009, pp. 348-349
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Toward Nanomagnetomechanical Systems Focused Ion Beam Milling of Ferromagnetic Garnets

  • D Vick, A Fraser, V Sauer, W Hiebert, M Freeman
  • Published online by Cambridge University Press:
    26 July 2009, pp. 350-351
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • TEM Characterization of Deformation and Failure Mechanisms in 40 nm and 5nm Cu/Nb Nanolayed Micro Compression Pillars

  • N Mara, D Bhattacharyya, P Dickerson, R Hoagland, A Misra
  • Published online by Cambridge University Press:
    26 July 2009, pp. 352-353
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • FIB/SEM Fabrication of Nanostructures for Plasmonic Sensors and Waveguides

  • A Madison, A Dhawan, M Gerhold, T Vo-Dinh, PE Russell, DN Leonard
  • Published online by Cambridge University Press:
    26 July 2009, pp. 354-355
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Nanofabrication of Multi-Layer Devices and Multiple Writing Fields Using Focused Ion Beam and DualBeam™ Instruments

  • O Wilhelmi, A Rosenthal, P Faber, F Morrissey, LY Roussel
  • Published online by Cambridge University Press:
    26 July 2009, pp. 356-357
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Damage Layers in Si vs. Ion Dose during 30 keV FIB Milling

  • S Rubanov
  • Published online by Cambridge University Press:
    26 July 2009, pp. 358-359
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Optimized Sample Preparation for the Imaging of Silicon Defects using Plan View Transmission Electron Microscopy

  • N Wang, A Myers, M Sidorov, H Koo, C Yuan, B Tracy, S Li
  • Published online by Cambridge University Press:
    26 July 2009, pp. 360-361
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Investigation of Surface Film Formed on Fine Mg Particles

  • J Li, GJ Kipouros, P Burke, C Bibby
  • Published online by Cambridge University Press:
    26 July 2009, pp. 362-363
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • The Time and Space of Pico-Deformation: Revealed Upon Unloading by 3D-FIB-EM

  • W Moberlychan, BS El-Dasher, GH Campbell
  • Published online by Cambridge University Press:
    26 July 2009, pp. 364-365
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • The Varying Fine Structure and Chemical Composition of Human Hair

  • A Halat, A Calabro, D Becker, J Morales
  • Published online by Cambridge University Press:
    26 July 2009, pp. 366-367
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Characterization of Dental Bonded Interface Degradation Using Focused Ion Beam and High-Resolution Transmission Electron Microscopy

  • S Duarte, A Avishai, A Sadan
  • Published online by Cambridge University Press:
    26 July 2009, pp. 368-369
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Focused Ion Beam Characterization of Bicomponent Polymer Fibers

  • K Wong, N Anantharamaiah, R Garcia, D Batchelor, B Pourdeyhimi, D Griffis
  • Published online by Cambridge University Press:
    26 July 2009, pp. 370-371
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Focused Ion Beam Tomography of Porous Titania Thin Films

  • D Vick, KK Krause, MJ Brett
  • Published online by Cambridge University Press:
    26 July 2009, pp. 372-373
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Sciences

Abstract

  • Lysosomal Cholesterol and Disease: Pharma Target or Decoy?

  • WG Jerome, JC Ullery
  • Published online by Cambridge University Press:
    26 July 2009, pp. 374-375
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Negative Stain Transmission Electron Microscopy of Viruses and Virus-like Particles

  • C Humphrey
  • Published online by Cambridge University Press:
    26 July 2009, pp. 376-377
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 17 of 47