Instrumentation and Techniques
Focused Ion Beam (FIB) Science and Technology: Fundamental Interactions,Instrumentation and Applications
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Dislocation Analysis of Semiconductor Devices using 3D Rotation Imaging Technique of Dedicated STEM
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- 26 July 2009, pp. 338-339
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Standard Free Thickness Determination of Thin TEM Samples via Backscatter Electron Image Correlation
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- 26 July 2009, pp. 340-341
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Towards Low-Damage TEM Sample Preparation of Carbonaceous Materials in the Focused Ion Beam
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- 26 July 2009, pp. 342-343
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Applications of SEM/FIB Technology in Life Science
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- 26 July 2009, pp. 344-345
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Focused Ion Beam-based Three Dimensional Analysis of Optic Nerve Axons
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- 26 July 2009, pp. 346-347
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Nanomilling for Aberration – Corrected TEM and HAADF STEM
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- 26 July 2009, pp. 348-349
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Toward Nanomagnetomechanical Systems Focused Ion Beam Milling of Ferromagnetic Garnets
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- 26 July 2009, pp. 350-351
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TEM Characterization of Deformation and Failure Mechanisms in 40 nm and 5nm Cu/Nb Nanolayed Micro Compression Pillars
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- 26 July 2009, pp. 352-353
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FIB/SEM Fabrication of Nanostructures for Plasmonic Sensors and Waveguides
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- 26 July 2009, pp. 354-355
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Nanofabrication of Multi-Layer Devices and Multiple Writing Fields Using Focused Ion Beam and DualBeam™ Instruments
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- 26 July 2009, pp. 356-357
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Damage Layers in Si vs. Ion Dose during 30 keV FIB Milling
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- 26 July 2009, pp. 358-359
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Optimized Sample Preparation for the Imaging of Silicon Defects using Plan View Transmission Electron Microscopy
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- 26 July 2009, pp. 360-361
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Investigation of Surface Film Formed on Fine Mg Particles
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- 26 July 2009, pp. 362-363
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The Time and Space of Pico-Deformation: Revealed Upon Unloading by 3D-FIB-EM
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- 26 July 2009, pp. 364-365
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The Varying Fine Structure and Chemical Composition of Human Hair
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- 26 July 2009, pp. 366-367
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Characterization of Dental Bonded Interface Degradation Using Focused Ion Beam and High-Resolution Transmission Electron Microscopy
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- 26 July 2009, pp. 368-369
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Focused Ion Beam Characterization of Bicomponent Polymer Fibers
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- 26 July 2009, pp. 370-371
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Focused Ion Beam Tomography of Porous Titania Thin Films
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- 26 July 2009, pp. 372-373
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Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Sciences
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Lysosomal Cholesterol and Disease: Pharma Target or Decoy?
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 374-375
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Negative Stain Transmission Electron Microscopy of Viruses and Virus-like Particles
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- 26 July 2009, pp. 376-377
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