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Volume 15 - April 2009

Contents

Page 15 of 47

Instrumentation and Techniques

Quantitative Atom-Probe Tomography

Abstract

  • Sensitivity And Quantitativity In Atom Probe Tomography

  • F Danoix, A Bostel, A Leitner, P Jessner, X Sauvage, M Gouné, R Danoix
  • Published online by Cambridge University Press:
    26 July 2009, pp. 258-259
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Promoting Standards in Quantitative Atom Probe Tomography Analysis

  • R Ulfig, TF Kelly, B Gault
  • Published online by Cambridge University Press:
    26 July 2009, pp. 260-261
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Review of Atom Probe Tomography Applications for Semiconductor materials

  • L Renaud, I Martin, B Salle, R Benbalagh, A Davis, M Schuhmacher
  • Published online by Cambridge University Press:
    26 July 2009, pp. 262-263
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Data Mining and Informatics for Quantitative Atom Probe Tomography

  • K Rajan, S Aluru, B Ganapathysubramanian
  • Published online by Cambridge University Press:
    26 July 2009, pp. 264-265
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Partitioning Behavior of Al and Si in FINEMET Nanocrystalline Soft Magnetic Alloys, as Studied by Atom-Probe Tomography

  • K Knipling, M Daniil, M Willard
  • Published online by Cambridge University Press:
    26 July 2009, pp. 266-267
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Grain Boundary Chemistry Before and After Ion Implantation in ODS Steels

  • EA Marquis, S Lozano-Perez, V de Castro
  • Published online by Cambridge University Press:
    26 July 2009, pp. 270-271
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Investigation of Self-assembled Monolayer by Atom Probe Microscopy

  • B Gault, W Yang, KR Ratinac, R Zheng, F Braet, SP Ringer
  • Published online by Cambridge University Press:
    26 July 2009, pp. 272-273
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • 3-D Atom Probe Tomography of Resin Embedded Samples?

  • JE Evans, I Arslan, DL Jaeger, EA Marquis, BP Gorman, ND Browning
  • Published online by Cambridge University Press:
    26 July 2009, pp. 274-275
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Impurity Measurments in Polycrystallline Material with Atom Probe Tomography

  • P Ronsheim, M Hatzistergos, P Flaitz
  • Published online by Cambridge University Press:
    26 July 2009, pp. 276-277
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • TEM and Atom Probe Tomography Characterization of High TMR MgO-Based Magnetic Tunnel Junctions

  • PM Rice, S-H Yang, SSP Parkin, EA Marquis, TJ Prosa, DJ Larson
  • Published online by Cambridge University Press:
    26 July 2009, pp. 278-279
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Atom Probe Tomography Studies of GaN-Based Semiconductor Materials

  • SE Bennett, RA Oliver, DW Saxey, A Cerezo, PH Clifton, R Ulfig, MJ Kappers, CJ Humphreys
  • Published online by Cambridge University Press:
    26 July 2009, pp. 280-281
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Investigation of Boron Delta-layers in Silicon Measured by Atom Probe Tomography (APT)

  • C Klein, S Mutas, A Würfel, E Zschech
  • Published online by Cambridge University Press:
    26 July 2009, pp. 282-283
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Nanoscale Microstructure in a Titanium Aluminide Alloy

  • S Gerstl, D Reinhard, DJ Larson
  • Published online by Cambridge University Press:
    26 July 2009, pp. 284-285
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Performance Improvements of Local Electrodes from In-situ Plasma Cleaning

  • R Ulfig, S Gerstl, TJ Prosa
  • Published online by Cambridge University Press:
    26 July 2009, pp. 286-287
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A UK Facility for Atom Probe Tomography Analysis

  • EA Marquis, DW Saxey, A Cerezo, GDW Smith
  • Published online by Cambridge University Press:
    26 July 2009, pp. 288-289
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Study of Atomic Force Microscopy Probes Using a Local Electrode Atom Probe Microscope

  • C Tourek, S Sundararajan
  • Published online by Cambridge University Press:
    26 July 2009, pp. 290-291
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Wide-Field-of-View Atom Probe Reconstruction

  • BP Geiser, DJ Larson, E Oltman, S Gerstl, D Reinhard, TF Kelly, TJ Prosa
  • Published online by Cambridge University Press:
    26 July 2009, pp. 292-293
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Improvements in Three-Dimensional Compositional Analysis of Complex Alloys

  • R Ulfig, E Oltman, DJ Larson, VS Smentkowski
  • Published online by Cambridge University Press:
    26 July 2009, pp. 294-295
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Pre-sharpened Microtips: An Efficient Sample Preparation Method for Atom Probe Tomography

  • R Shivaraman, R Ulfig, DJ Larson, H Fukuzawa, DC Bell, H Wang, R Gordon
  • Published online by Cambridge University Press:
    26 July 2009, pp. 296-297
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 15 of 47