Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
  1. Home
  2. Journals
  3. Microscopy and Microanalysis
  4. Volume 15
Journal Home
Refine listing

Refine listing

Access:
Publication date:
Topic: Show more

Actions for selected content:

Select all | Deselect all
  • View selected items
  • Export citations
  • Download PDF (zip)
  • Save to Kindle
  • Save to Dropbox
  • Save to Google Drive

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Please provide a title, maximum of 40 characters.
Cancel
×
< Back to all issues

Volume 15 - April 2009

Contents

Page 13 of 47

Instrumentation and Techniques

Exhibitor Symposium: Making the Nano-Future Real: Instruments and Techniques that are Impacting Todays Research for Tomorrows Breakthroughs

Abstract

  • EBSD Analysis of Strain

  • MM Nowell, SI Wright
  • Published online by Cambridge University Press:
    26 July 2009, pp. 178-179
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Advancements in Integrated Micro-XRF in the SEM

  • KC Witherspoon, BJ Cross, RD Lamb, PO Sjoman
  • Published online by Cambridge University Press:
    26 July 2009, pp. 180-181
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Towards an FE-SEM as a complete analytical laboratory

  • JP Stodolka, MG Schweitzer, TA Albrecht
  • Published online by Cambridge University Press:
    26 July 2009, pp. 182-183
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • High and Low Beam Energy Imaging: Complementarity in a Monochromated XHR SEM

  • LY Roussel, I Gestmann, M Darus, F Morrissey, DJ Stokes
  • Published online by Cambridge University Press:
    26 July 2009, pp. 186-187
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Development of a 200kV Atomic Resolution Analytical Electron Microscope

  • I Ishikawa, E Okunishi, H Sawada, Y Okura, K Yamazaki, T Ishikawa, M Kawazu, M Hori, M Terao, M Kanno, S Tanba, Y Kondo
  • Published online by Cambridge University Press:
    26 July 2009, pp. 188-189
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • LM-STEM Study of Dislocations in Thick Silicon

  • D Tang, A Rucki, H Cerva, P Schlossmacher
  • Published online by Cambridge University Press:
    26 July 2009, pp. 190-191
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A New and Fast Method for the Creation of 3D Micro and Nano Structures

  • JJL Mulders, JS Faber
  • Published online by Cambridge University Press:
    26 July 2009, pp. 192-193
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • High Efficiency CT (HECT) for Automated Alignment and Contrast Calibration of Projections in Quantitative TEM Tomography

  • WR Jarisch, AC Dohnalkova
  • Published online by Cambridge University Press:
    26 July 2009, pp. 194-195
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Hands Free, Automated Transmission Electron Microscopy (TEM) Wedge Sample Preparation.

  • E Raz-Moyal, D Erwin
  • Published online by Cambridge University Press:
    26 July 2009, pp. 196-197
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Latest Developments in Todays TEM Camera Systems

  • J Wickersham, J Krieger, C Huelk
  • Published online by Cambridge University Press:
    26 July 2009, pp. 198-199
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

David B. Wittry Memorial Symposium on Advances in Detectors in Microscopy and Microanalysis, Related Techniques, and Their Applications

Abstract

  • Silicon Based Electron, Optical and X-ray Imagers

  • P Rehak
  • Published online by Cambridge University Press:
    26 July 2009, pp. 200-201
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • New Detector Architecture, for Electron Microscopes with SDDs

  • H Soltau, O Jaratschin, A Liebel, A Niculae, A Simsek, R Eckhard, K Hermenau, P Lechner, G Lutz, G Schaller, F Schopper, L Strüder
  • Published online by Cambridge University Press:
    26 July 2009, pp. 204-205
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Characterization of an Annular Four-channel Silicon Drift Detector with a Light Element Window

  • R Terborg, M Rohde
  • Published online by Cambridge University Press:
    26 July 2009, pp. 206-207
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • An integrated Silicon Drift Detector System for FEI Schottky Field Emission Transmission Electron Microscopes

  • HS von Harrach, P Dona, B Freitag, H Soltau, A Niculae, M Rohde
  • Published online by Cambridge University Press:
    26 July 2009, pp. 208-209
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Aberration Correction in Energy Loss Spectrometers and Monochromators

  • O Krivanek, J Ursin, GJ Corbin, N Dellby, M Murfitt, C Own, Z Szilagyi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 210-211
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Automatic Correction of Spectral Aberrations in EELS

  • N Menon, M Barfels, P Thomas
  • Published online by Cambridge University Press:
    26 July 2009, pp. 212-213
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Development of TEM-SXES instruments for valence electron spectroscopy

  • M Terauchi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 214-215
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A New Wavelength Spectrometer for SEM Analysts

  • P Camus
  • Published online by Cambridge University Press:
    26 July 2009, pp. 216-217
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 13 of 47