Physical Sciences
Microscopy and Microanalysis of Nanostructured Materials
Abstract
Imaging of GaAs Nanowire Using Combined Aberration-corrected TEM/STEM and Exit Wave Restoration
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- 26 July 2009, pp. 138-139
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Irradiation Damage and Modifications of Materials
Abstract
Nanoparticles and Nanopores Induced by High-energy Electron Irradiation
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- 26 July 2009, pp. 140-141
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Ion Irradiation-Induced Changes in Surface Morphology of InSb
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- 26 July 2009, pp. 142-143
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Characterization of Materials for Responsible Energy Generation and Use
Abstract
Nanowires for Energy Applications: Fundamental Growth Studies
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- 26 July 2009, pp. 144-145
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Pt-Co Bimetallic Catalysts for PEM Fuel Cell Cathodes
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- 26 July 2009, pp. 146-147
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Microstructural Characterization of CdTe and CIGS Thin Film Solar Cells by Analytical Transmission Electron Microscopy
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- 26 July 2009, pp. 148-149
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The Otto Scherzer Memorial Symposium on Aberration-Corrected Electron Microscopy
Abstract
Development of Correctors: From O. Scherzer to TEAM
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- 26 July 2009, pp. 150-151
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Scanning Transmission Electron Microscopy: The Major Beneficiary of Aberration Correction?
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- 26 July 2009, pp. 152-153
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Applications of Aberration-corrected TEM and STEM in Complex Oxides and Nanostructured Materials
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- 26 July 2009, pp. 154-155
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ArcheoMetallurgy: Analyses & Characterization
Abstract
Puddled or Forged? A Steel Bar in the Cathedral of México, from the XVIII Century
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- 26 July 2009, pp. 156-157
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Steel Hull Corrosion of USS Arizona with Applications to Submerged Resources
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- 26 July 2009, pp. 158-159
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Instrumentation and Techniques
IMS Henry Clifton Sorby Award and Lecture
Abstract
Characteristics of Exfoliation Corrosion at Weldments in an Al-Zn-Mg Alloy
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- 26 July 2009, pp. 160-161
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Exhibitor Symposium: Making the Nano-Future Real: Instruments and Techniques that are Impacting Todays Research for Tomorrows Breakthroughs
Abstract
Microwave Radiation is a Versatile Technology for Tissue Processing
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- 26 July 2009, pp. 162-163
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Visualization of Light Elements at Ultrahigh Resolution by STEM Annular Bright Field Microscopy
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- 26 July 2009, pp. 164-165
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Development of a Fast CCD Camera for Electron Diffraction Imaging in Conventional TEM
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- 26 July 2009, pp. 166-167
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Versatile Monochromator Module for XHR SEM
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- 26 July 2009, pp. 168-169
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In-situ Low Energy Argon Ion Milling of Nanoelectronic Structures Using a Triple Beam System
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- 26 July 2009, pp. 170-171
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X-Max Large Area SDD Detectors - Creating a Real Impact on Nano-Science
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- 26 July 2009, pp. 172-173
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An Improved Large Area Silicon Drift Detector EDS System for Low Energy X-ray Detection and Fast Spectrum Imaging
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- 26 July 2009, pp. 174-175
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Quantitative Characterisation of Surface and Interface Chemistry with X-ray Photoelectron Spectroscopy (XPS)
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- 26 July 2009, pp. 176-177
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