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Volume 15 - April 2009

Contents

Page 14 of 47

Instrumentation and Techniques

David B. Wittry Memorial Symposium on Advances in Detectors in Microscopy and Microanalysis, Related Techniques, and Their Applications

Abstract

  • A New Detector for Backscattered Helium Ions in the 30 keV Energy Range

  • S Sijbrandij, J Notte, B Thompson, C Huynh, C Sanford, L Scipioni
  • Published online by Cambridge University Press:
    26 July 2009, pp. 220-221
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Low-Energy Secondary Electron Filtering with Immersion Lens SEM

  • R Young, E Bosch, M Uncovsky, L Tuma
  • Published online by Cambridge University Press:
    26 July 2009, pp. 222-223
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Latest Developements in the New Wavelength Dispersive Solid-State Detector

  • D Lesher, Y Diawara, S Medved, R Durst, V Sedov
  • Published online by Cambridge University Press:
    26 July 2009, pp. 224-225
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Reduce Correlated Noise in EELS Spectrum with High Quality Dark Reference

  • V-DH Hou
  • Published online by Cambridge University Press:
    26 July 2009, pp. 226-227
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Performance of a Silicon-Drift Detector in 200kV TEM Environments

  • LF Allard, S Rozeveld
  • Published online by Cambridge University Press:
    26 July 2009, pp. 228-229
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Accurate Quantitative EDS Mapping at High Count Rates with a Large Area Silicon Drift Detector

  • CL Collins, J Holland, SR Burgess, P Statham, N Rowlands
  • Published online by Cambridge University Press:
    26 July 2009, pp. 230-231
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Real-Time Pulse Pile-up Recovery in X-ray Detector Data

  • PAB Scoullar, RJ Evans
  • Published online by Cambridge University Press:
    26 July 2009, pp. 232-233
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A Noise-Tolerant Method for Measuring MTF from Found-Object Edges in a TEM

  • PE Mooney
  • Published online by Cambridge University Press:
    26 July 2009, pp. 234-235
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Image Quality Improvements in Thermionic Scanning Electron Microscopes

  • D Phifer, P Wandrol, T Vystavel
  • Published online by Cambridge University Press:
    26 July 2009, pp. 236-237
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Incoherent Bright Field STEM for Imaging and Tomography of Ultra-Thick TEM Cross-sections

  • P Ercius, DA Muller
  • Published online by Cambridge University Press:
    26 July 2009, pp. 238-239
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A Novel Time-Resolved Fluorescence Microscope System Extended from the Deep UV-Visible to NIR (240nm - 1700nm)

  • L Chandler
  • Published online by Cambridge University Press:
    26 July 2009, pp. 240-241
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Development of a Micro Mass Spectrometer: Analysis of Particle Behavior in MEMS Ion Lens Systems

  • Z Russell, PE Russell, J Glass, C Parker, B Stoner, K Gilchrist, J Piascik
  • Published online by Cambridge University Press:
    26 July 2009, pp. 242-243
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Quantitative Atom-Probe Tomography

Abstract

  • Applications of Spatial Distribution Maps for Advanced Atom Probe Reconstruction and Data Analysis

  • M Moody, B Gault, L Stephenson, S Ringer
  • Published online by Cambridge University Press:
    26 July 2009, pp. 246-247
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Evaluation of Local Radii of Atom-Probe-Tomography Specimens

  • S Gerstl, BP Geiser, TF Kelly, DJ Larson
  • Published online by Cambridge University Press:
    26 July 2009, pp. 248-249
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Correlation between TEM Imaging and Microanalysis for Atom Probe Reconstruction Verification

  • G Thompson, A Genc, R Morris, K Torres, HL Fraser
  • Published online by Cambridge University Press:
    26 July 2009, pp. 250-251
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Cluster Detection and Quantification

  • DJ Larson, MK Miller
  • Published online by Cambridge University Press:
    26 July 2009, pp. 252-253
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Techniques for Consecutive TEM and Atom Probe Tomography Analysis of Nanowires

  • D Diercks, BP Gorman, CL Cheung, G Wang
  • Published online by Cambridge University Press:
    26 July 2009, pp. 254-255
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Background Removal Methods Applied to Atom Probe Data

  • E Oltman, R Ulfig, DJ Larson
  • Published online by Cambridge University Press:
    26 July 2009, pp. 256-257
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 14 of 47