Instrumentation and Techniques
David B. Wittry Memorial Symposium on Advances in Detectors in Microscopy and Microanalysis, Related Techniques, and Their Applications
Abstract
Enhancement of Low Energy / Light Element Energy Dispersive Analysis in the Scanning Electron Microscope Using a Non-Focusing X-Ray Optic
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- 26 July 2009, pp. 218-219
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A New Detector for Backscattered Helium Ions in the 30 keV Energy Range
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- 26 July 2009, pp. 220-221
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Low-Energy Secondary Electron Filtering with Immersion Lens SEM
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- 26 July 2009, pp. 222-223
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Latest Developements in the New Wavelength Dispersive Solid-State Detector
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- 26 July 2009, pp. 224-225
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Reduce Correlated Noise in EELS Spectrum with High Quality Dark Reference
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- 26 July 2009, pp. 226-227
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Performance of a Silicon-Drift Detector in 200kV TEM Environments
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- 26 July 2009, pp. 228-229
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Accurate Quantitative EDS Mapping at High Count Rates with a Large Area Silicon Drift Detector
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- 26 July 2009, pp. 230-231
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Real-Time Pulse Pile-up Recovery in X-ray Detector Data
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- 26 July 2009, pp. 232-233
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A Noise-Tolerant Method for Measuring MTF from Found-Object Edges in a TEM
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- 26 July 2009, pp. 234-235
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Image Quality Improvements in Thermionic Scanning Electron Microscopes
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- 26 July 2009, pp. 236-237
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Incoherent Bright Field STEM for Imaging and Tomography of Ultra-Thick TEM Cross-sections
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- 26 July 2009, pp. 238-239
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A Novel Time-Resolved Fluorescence Microscope System Extended from the Deep UV-Visible to NIR (240nm - 1700nm)
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- 26 July 2009, pp. 240-241
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Development of a Micro Mass Spectrometer: Analysis of Particle Behavior in MEMS Ion Lens Systems
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- 26 July 2009, pp. 242-243
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Quantitative Atom-Probe Tomography
Abstract
Atom-probe Tomography, Small Angle Neutron Scattering, Transmission Electron Microscopy, Positron Annihilation Spectroscopy and X-ray Absorption Spectroscopy Characterization of Nano-scale Features in Nanostructured Ferritic Alloys
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 244-245
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Applications of Spatial Distribution Maps for Advanced Atom Probe Reconstruction and Data Analysis
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- 26 July 2009, pp. 246-247
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Evaluation of Local Radii of Atom-Probe-Tomography Specimens
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- 26 July 2009, pp. 248-249
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Correlation between TEM Imaging and Microanalysis for Atom Probe Reconstruction Verification
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- 26 July 2009, pp. 250-251
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Cluster Detection and Quantification
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- 26 July 2009, pp. 252-253
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Techniques for Consecutive TEM and Atom Probe Tomography Analysis of Nanowires
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- 26 July 2009, pp. 254-255
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Background Removal Methods Applied to Atom Probe Data
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- 26 July 2009, pp. 256-257
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