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An Improved Large Area Silicon Drift Detector EDS System for Low Energy X-ray Detection and Fast Spectrum Imaging

Published online by Cambridge University Press:  26 July 2009

L Feng ,
VD Saveliev ,
M Takahashi ,
CR Tull ,
S Barkan ,
EV Damron ,
S Kosuge ,
RD Lamb ,
KC Witherspoon  and
PO Sjoman
L Feng
Affiliation:
SII NanoTechnology USA,Inc
VD Saveliev
Affiliation:
SII NanoTechnology USA,Inc
M Takahashi
Affiliation:
SII NanoTechnology USA,Inc
CR Tull
Affiliation:
SII NanoTechnology USA,Inc
S Barkan
Affiliation:
SII NanoTechnology USA,Inc
EV Damron
Affiliation:
SII NanoTechnology USA,Inc
S Kosuge
Affiliation:
SII NanoTechnology USA,Inc
RD Lamb
Affiliation:
IXRF Systems,Inc
KC Witherspoon
Affiliation:
IXRF Systems,Inc
PO Sjoman
Affiliation:
IXRF Systems,Inc

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 174 - 175
Copyright
Copyright © Microscopy Society of America 2009