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Volume 15 - April 2009

Contents

Page 19 of 47

Instrumentation and Techniques

Metals and Minerals and Microstructure: Applications and Advances of Electron Backscatter Diffraction (EBSD)

Abstract

  • Interactive EBSD Based Analysis of a Fatigue Crack in a Nickel Superalloy

  • MM Nowell, SI Wright, R de Kloe
  • Published online by Cambridge University Press:
    26 July 2009, pp. 418-419
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Characterizing Ultrafine Grained Material using EBSD

  • A Deal, R Bhat, R DiDomizio, J Marte, PR Subramanian
  • Published online by Cambridge University Press:
    26 July 2009, pp. 420-421
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Development of Tools to Increase the Spatial Resolution of EBSD Maps

  • PT Pinard, P Hovington, M Lagacé, R Gauvin
  • Published online by Cambridge University Press:
    26 July 2009, pp. 422-423
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Characterization of CVD Graphene Films on Ni Substrate by EBSD and Low-kV EDS

  • DC Bell, N Erdman, J Kong, A Reina
  • Published online by Cambridge University Press:
    26 July 2009, pp. 424-425
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Quantitative Analysis at the NanoScale - XEDS, EELS, SIMS, HAADF

Abstract

  • Quantitative Analysis of Alloy Structure by Aberration Corrected STEM

  • M Weyland, B Muddle
  • Published online by Cambridge University Press:
    26 July 2009, pp. 426-427
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron Energy-Loss Spectrometry (EELS) and Energy-Filtered TEM (EFTEM) Analyses of Organic-Inorganic Nanoparticles

  • AL Koh, M Watanabe, R Sinclair
  • Published online by Cambridge University Press:
    26 July 2009, pp. 432-433
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Atomic Scale EELS Study of the Origin of Ferromagnetism in Co doped ZnO Epitaxial Thin Films

  • QM Ramasse, AP Kuprin, M Chi, TC Kaspar, SA Chambers, ND Browning
  • Published online by Cambridge University Press:
    26 July 2009, pp. 436-437
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Automated Mapping of Multiple Elements for Dose-Efficient Elemental Quantification using EFTEM

  • A Aitouchen, P Thomas
  • Published online by Cambridge University Press:
    26 July 2009, pp. 438-439
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Structural and Chemical Details of La05Sr0.5CoO3-δ Thin Films

  • J Gazquez, M Varela, MP Oxley, W Luo, ST Pantelides, MA Torija, M Sharma, C Leighton, SJ Pennycook
  • Published online by Cambridge University Press:
    26 July 2009, pp. 440-441
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Atomic-resolution STEM and variable-temperature EELS Studies of Thermoelectric Ca3Co4O9

  • G Yang, QM Ramasse, RF Klie
  • Published online by Cambridge University Press:
    26 July 2009, pp. 442-443
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Quantification of Manganese Valence States Using Mn L2,3 Electron Energy-Loss Near-Edge Spectra

  • S Zhang, K Livi, A-C Gaillot, D Veblen
  • Published online by Cambridge University Press:
    26 July 2009, pp. 444-445
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Reliable Quantification of EELS Spectra with a Simple Model–Based Approach

  • G Duscher, ME Hmielewski, JDO Oduor
  • Published online by Cambridge University Press:
    26 July 2009, pp. 446-447
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Factors Affecting Elemental Quantification at the atomic Scale Using EELS

  • R Srinivasan, GB Viswanathan, J Sosa, D McComb, J Ringnalda, HL Fraser
  • Published online by Cambridge University Press:
    26 July 2009, pp. 448-449
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Using Neural Network Algorithms for Compositional Mapping in STEM EELS

  • AY Borisevich, SV Kalinin, AR Lupini, S Jesse, HJ Chang, M Hujiben, R Ramesh, SJ Pennycook
  • Published online by Cambridge University Press:
    26 July 2009, pp. 450-451
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Nanoscale Imaging of Photonic Densities of States in Finite Photonic Structures

  • JJ Cha, E Smith, M Couillard, DA Muller
  • Published online by Cambridge University Press:
    26 July 2009, pp. 452-453
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A EELS Sub Nanometer Investigation of the Dielectric Gate Stack for the Realization of InGaAs Based MOSFET Devices

  • P Longo, MC Holland, GW Paterson, AJ Craven, IG Thayne
  • Published online by Cambridge University Press:
    26 July 2009, pp. 454-455
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Quantitative STEM-EDS Mapping and Analysis

  • C Parish, L Brewer
  • Published online by Cambridge University Press:
    26 July 2009, pp. 456-457
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 19 of 47