Instrumentation and Techniques
Failure Analyses: Practical Metallography/Fractography in Case Studies
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High Contact Resistance in Spring Loaded Micro-Switches
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 498-499
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Counting on Fatigue- Striations and Their Measure
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- 26 July 2009, pp. 500-501
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Fractographic Analyses of Creep and Fatigue Induced Failures in an Alpha Titanium-Aluminum Alloy
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- 26 July 2009, pp. 502-503
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Impact Fatigue Failure of Ordnance Components
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- 26 July 2009, pp. 504-505
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Disastrous Failure of a Carbide-Studded Cutting Disc
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- 26 July 2009, pp. 506-507
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Grain Structure at Crack Path in Fatigued Nano-Crystalline Ni
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- 26 July 2009, pp. 508-509
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Problem Solving Using Microanalysis in the Real World
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A Multifaceted Approach to Particle Analysis
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- 26 July 2009, pp. 510-511
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Using DTSA-II to Simulate and Interpret an X-ray Spectrum Image from a K411 Microparticle
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- 26 July 2009, pp. 512-513
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Use of Multilayer Correction Procedures to Improve the Quantitative Electron Microprobe Analyses of Coated Insulating Specimens
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- 26 July 2009, pp. 514-515
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Electron Probe Microanalysis of Thin Films and Multilayers Using the X-FILM Computer Code
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- 26 July 2009, pp. 516-517
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Challenges Involved In X-Ray Microanalysis Of The Mineral Kernite [Na2B4O6(OH)2P3H2O]
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- 26 July 2009, pp. 518-519
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Calculating the Detector Solid Angle in X-ray Energy Dispersive Spectroscopy
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- 26 July 2009, pp. 520-521
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The Discovery and Characterisation of a New U Mineral from Ilimaussaq Alkali Complex – Greenland
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- 26 July 2009, pp. 522-523
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Quantitative Metallography And Microanalytical Analysis Of Particles In Iron Rivets Recovered From The Wreck Of The RMS Titanic
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- 26 July 2009, pp. 524-525
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EPMA of K and Na in Two Types of Aged NOx Catalysts for Diesel Engines
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- 26 July 2009, pp. 526-527
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Prospects for Single Standard Quantitative Analysis with SDD
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- 26 July 2009, pp. 528-529
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A Solution to the Problem of X-Ray Mapping Samples with Surface Roughness
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- 26 July 2009, pp. 530-531
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Elevation Resolved Elemental Mapping with SEM/EDS
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- 26 July 2009, pp. 532-533
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Advances in Electron-Probe Microanalysis and Compositional Mapping: Applications to the Analysis of Meteorites
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- 26 July 2009, pp. 534-535
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Transitioning Laser Ablation ICP-MS from Research Applications to Routine Trace Element Microanalysis: A Look at Quantitative Trace Element Analyses and Imaging
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- 26 July 2009, pp. 536-537
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