Instrumentation and Techniques
Three-Dimensional Imaging in the Biological and Materials Sciences: Bridging Nano and Micron Scales
Abstract
Possible Skin Fragment Evidence is Found in Incomplete Fingerprints
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- 26 July 2009, pp. 620-621
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3D Confocal Imaging of Pollen
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- 26 July 2009, pp. 622-623
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Serial Block-face Scanning Electron Microscopic Correlative Methods for Mapping Neuronal Interconnectivity
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- 26 July 2009, pp. 624-625
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Simplifying Minimum Dose Electron Tomography
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- 26 July 2009, pp. 626-627
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Guidelines for Adapting Light Microscopy Deconvolution Methods to 3D Biological STEM
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- 26 July 2009, pp. 628-629
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TEM and STEM Tomography for thick polymer sample
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- 26 July 2009, pp. 630-631
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3-D Scanning Transmission Electron Microscopy of Carbide-Derived Carbons for Electrical Energy Storage
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- 26 July 2009, pp. 632-633
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Three-Dimensional Observation of Edge-Roughness on Poly-Si/TiN Stacked Gate Using Three-Dimensional STEM
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- 26 July 2009, pp. 634-635
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Three-dimensional Observation of Carbon Nanostructures with Confocal Scanning Tansmission Electron Microscopy
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- 26 July 2009, pp. 636-637
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The 3-D Pore Structure of Pd Nanoparticles as a Function of Temperature
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- 26 July 2009, pp. 638-639
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Grain Boundary Curvature Analysis of β -Grains in Ti-21S
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- 26 July 2009, pp. 640-641
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Fast Throughput Low Voltage Scanning Transmission Electron Microscope Imaging of Nano-Resolution Three Dimensional Tissue
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- 26 July 2009, pp. 642-643
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Analysis of Simian Virus 40 Chromatin Structure by Cryo-Electron Tomography
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- 26 July 2009, pp. 644-645
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Electron-Tomography of a Temperature-Sensitive Morphogenic Mutant of Rous Sarcoma Virus (RSV)
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- 26 July 2009, pp. 646-647
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High Resolution Scanning Microscopy - Ions to Electrons
Abstract
Choosing a Beam-Electrons,Protons, He or Ga ions?
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- 26 July 2009, pp. 648-649
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Contrast Mechanisms in Ga+ Ion Induced Secondary Electron Images
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- 26 July 2009, pp. 650-651
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One Year On: New and Unique Applications of He Ion Microscopy
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- 26 July 2009, pp. 652-653
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Advances in High Resolution Helium Ion Microscope (HIM) Imaging
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- 26 July 2009, pp. 654-655
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Superior Imaging Quality of Scanning Helium-Ion Microscopy: a Look at Beam-Sample Interactions,
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- 26 July 2009, pp. 656-657
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Precision Material Modification and Patterning with Helium Ions
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- 26 July 2009, pp. 658-659
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