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Volume 15 - April 2009

Contents

Page 25 of 47

Instrumentation and Techniques

High Resolution Scanning Microscopy - Ions to Electrons

Abstract

  • Challenges in Achieving High Resolution at Low Voltages in the SEM

  • JR Michael, DC Joy, BJ Griffin
  • Published online by Cambridge University Press:
    26 July 2009, pp. 660-661
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A Study of the Behavior of SE and BSE in UltraLow Landing Voltage Condition

  • A Miyaki, S Takeuchi, A Muto, Y Dan, T Sawahata, M Nakagawa, T Teranishi, Y Majima
  • Published online by Cambridge University Press:
    26 July 2009, pp. 662-663
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Challenges in Low Voltage Imaging in the FE-SEM

  • R Gauvin
  • Published online by Cambridge University Press:
    26 July 2009, pp. 664-665
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Can X-ray Spectrum Imaging (XSI) Replace Backscattered Electron (BSE) Imaging for Compositional Contrast in the Scanning Electron Microscope?

  • DE Newbury
  • Published online by Cambridge University Press:
    26 July 2009, pp. 666-667
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Reference Material (RM) 8820: A New Scanning Electron Microscope Scale Calibration Artifact

  • AE Vladár, MT Postek
  • Published online by Cambridge University Press:
    26 July 2009, pp. 668-669
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Imaging Fundamental Electronic Excitations at High Spatial Resolution Using Scanning Cathodoluminescence Microscopy

  • MR Phillips, D Drouin, SJ Moody, C Ton-That
  • Published online by Cambridge University Press:
    26 July 2009, pp. 670-671
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Secondary Electron Grain Contrast Induced by Incident Electrons in a Electroplated Copper Thin Film

  • H Demers, E Lifshin
  • Published online by Cambridge University Press:
    26 July 2009, pp. 672-673
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

In Situ Microscopy: Real Time Correlation of Structure, Processing, and Properties

Abstract

  • In-Situ Microstructure Evolution Under Stress Using a Large-Chamber SEM

  • R Woracek, S Young, D Penumadu, JJ Frafjord
  • Published online by Cambridge University Press:
    26 July 2009, pp. 676-677
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ Orientation Imaging of Recrystallization and Grain Growth in OFHC Copper

  • MM Nowell, SI Wright, JO Carpenter
  • Published online by Cambridge University Press:
    26 July 2009, pp. 678-679
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A High Temperature ESEM Investigation into the Separation of MgCl2 from MgCl2 - Ti Mixture

  • AM Glenn, C Doblin, CM MacRae
  • Published online by Cambridge University Press:
    26 July 2009, pp. 680-681
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • An ESEM Study of the Influence of Humidity in the Integrity of Mascara Films

  • GA Camacho-Bragado, FM Dixon, NJ Zaluzec
  • Published online by Cambridge University Press:
    26 July 2009, pp. 682-683
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ Tensile-Creep Deformation Observations of a Cobalt-based Superalloy

  • S Longanbach, C Boehlert
  • Published online by Cambridge University Press:
    26 July 2009, pp. 684-685
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Liquid and Three-Dimensional Scanning Transmission Electron Microscopy for Biological Specimen

  • N de Jonge, MJ Dukes, GJ Kremers, BM Northan, DB Peckys, EA Ring, DW Piston, R Sougrat
  • Published online by Cambridge University Press:
    26 July 2009, pp. 686-687
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ Synthesis of PtSn/C Fuel Cell Nanocatalysts in Aberration-Corrected TEM/STEM

  • J Liu, J Braddock-Wilking, LF Allard
  • Published online by Cambridge University Press:
    26 July 2009, pp. 688-689
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ TEM Characterization of Nucleation and Growth of Nanopatterned Oxides

  • A Yan, T Sun, VP Dravid
  • Published online by Cambridge University Press:
    26 July 2009, pp. 690-691
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ Observation of Au/TiO2 Catalyst in Oxygen-Gas Environments

  • T Tanaka, K Sano, M Ando, H Sawada, F Hosokawa, E Okunishi, Y Kondo, Y Tanishiro, K Takayanagi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 692-693
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • High Resolution In-Situ Heating TEM Study of Nanocrystals

  • XF Zhang
  • Published online by Cambridge University Press:
    26 July 2009, pp. 694-695
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Imaging Particle Analysis Using a High Resolution In-Flow Imaging Flow Cytometer with Oil Immersion Optics

  • L Brown, C Sieracki
  • Published online by Cambridge University Press:
    26 July 2009, pp. 696-697
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-Situ TEM Observation of Metal Zn Nanocrystal Growth on ZnO Films

  • JM Yuk, K Kim, Z Lee, M Watanabe, A Zettl, JY Lee, YS No, TW Kim, WK Choi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 698-699
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 25 of 47