High Resolution In-Situ Heating TEM Study of Nanocrystals

XF Zhang

doi:10.1017/S1431927609094549

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High Resolution In-Situ Heating TEM Study of Nanocrystals

Published online by Cambridge University Press: 26 July 2009

XF Zhang

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XF Zhang*: Affiliation:
Hitachi High Technologies America,Inc

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type: Abstract
Information: Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 694 - 695

DOI: https://doi.org/10.1017/S1431927609094549 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2009

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High Resolution In-Situ Heating TEM Study of Nanocrystals

Volume 15, Supplement S2
XF Zhang ^(a1)
DOI: https://doi.org/10.1017/S1431927609094549

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High Resolution In-Situ Heating TEM Study of Nanocrystals

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